학술논문
'학술논문'
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1~10
Conference
Gehres, R.; Malik, R.; Amos, R.; Brown, J.; Butt, S.; Chan, A.; Collins, C.; Colwill, B.; Davies, B.; Gabor, A.; Le, N.; Lindo, P.; Mello, K.; Meyette, E.; Nastasi, V.; Patrick, J.; Piper, A.; Prakash, D.P.; Rust, T.; Santiago, A.; Su, T.; Van Roijen, R.; Rutten, M.; Slisher, D.; Tessier, B.; Tetzloff, J.; Wehella-Gamage, D.; Wise, R.; Yang, Q.; Yu, C.; Divakaruni, R.; Goth, G.
The 17th Annual SEMI/IEEE ASMC 2006 Conference Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE. :411-416 2006
Conference
Khare, M.; Ku, S.H.; Donaton, R.A.; Greco, S.; Brodsky, C.; Chen, X.; Chou, A.; DellaGuardia, R.; Deshpande, S.; Doris, B.; Fung, S.K.H.; Gabor, A.; Gribelyuk, M.; Holmes, S.; Jamin, F.F.; Lai, W.L.; Lee, W.H.; Li, Y.; McFarland, P.; Mo, R.; Mittl, S.; Narasimha, S.; Nielsen, D.; Purtell, R.; Rausch, W.; Sankaran, S.; Snare, J.; Tsou, L.; Vayshenker, A.; Wagner, T.; Wehella-Gamage, D.; Wu, E.; Wu, S.; Yan, W.; Barth, E.; Ferguson, R.; Gilbert, P.; Schepis, D.; Sekiguchi, A.; Goldblatt, R.; Welser, J.; Muller, K.P.; Agnello, P.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :407-410 2002
Conference
Yang, B.; Nummy, K.; Waite, A.; Black, L.; Gossmann, H.; Yin, H.; Liu, Y.; Kim, B.; Narasimha, S.; Fisher, P.; Meer, H. V.; Johnson, J.; Chidambarrao, D.; Kim, S.D.; Sheraw, C.; Wehella-gamage, D.; Holt, J.; Chen, X.; Park, D.; Sung, C.Y.; Schepis, D.; Khare, M.; Luning, S.; Agnello, P.
2007 IEEE Symposium on VLSI Technology VLSI Technology, 2007 IEEE Symposium on. :126-127 Jun, 2007
Conference
Agnello, P.; Ivers, T.; Warm, C.; Wise, R.; Wachnik, R.; Schepis, D.; Sankaran, S.; Norum, J.; Luning, S.; Li, Y.; Khare, M.; Grill, A.; Edelstein, D.; Chen, X.; Brown, D.; Augur, R.; Wu, S.; Yu, J.; Wong, R.C.; Werking, J.; Wehella-Gamage, D.; Vayshenker, A.; Van Meer, H.; Van Den Nieuwenhuizen, R.; Tian, C.; Tabakman, K.; Sung, C.Y.; Standaert, T.; Simon, A.; Sim, J.; Sheraw, C.; Restaino, D.; Rausch, W.; Pal, R.; Prindle, C.; Ouyang, X.; Ouyang, C.; Ontalus, V.; Nummy, K.; Nielsen, D.; Nicholson, L.; McKnight, A.; Lustig, N.; Liu, X.; Lee, M.H.; Lea, D.; Larosa, G.; Landers, W.; Kim, B.; Kelling, M.; Jeng, S.-J.; Holt, J.; Hargrove, M.; Grunow, S.; Greco, S.; Gates, S.; Frye, A.; Fisher, P.; Domenicucci, A.; Dimitrakopoulos, C.; Costrini, G.; Chou, A.; Cheng, J.; Butt, S.; Black, L.; Belyansky, M.; Ahsan, I.; Adam, T.; Gabor, A.; Wu, C.-H.J.; Yang, D.; Crouse, M.; Robinson, C.; Corliss, D.; Fonseca, C.; Johnson, J.; Weybright, M.; Waite, A.; Nayfeh, H.M.; Onishi, K.; Narasimha, S.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Conference
Ramadout, B.; Staiger, T.; Moll, H.-P.; Patterson, O.D.; Wehella-Gamage, D.; Wallner, J.; Babich, K.
In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018 , 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018. (2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 5 June 2018, :244-248)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Design-Process-Technology Co-optimization for Manufacturability XI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10148)
Conference
Lutich, A.; Weishbuch, F.; Herrmann, T.; Pritchard, D.; Rashed, M.; Guha Neogi, T.; Verma, P.; Permana, D.; Wehella-Gamage, D.; Ramadout, B.F.C.; Vangara, G.; Sun, K.; Babich, K.; Jain, N.; Kim, J.
In: Proceedings of SPIE - The International Society for Optical Engineering , Design-Process-Technology Co-optimization for Manufacturability XI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10148)
Conference
Narasimha, S.; Onishi, K.; Nayfeh, H.M.; Weybright, M.; Johnson, J.; Fonseca, C.; Corliss, D.; Robinson, C.; Crouse, M.; Yang, D.; Wu, C.-H.J.; Gabor, A.; Adam, T.; Ahsan, I.; Belyansky, M.; Butt, S.; Chou, A.; Costrini, G.; Dimitrakopoulos, C.; Domenicucci, A.; Frye, A.; Gates, S.; Greco, S.; Grunow, S.; Holt, J.; Jeng, S.-J.; Kim, B.; Landers, W.; Larosa, G.; Lea, D.; Lee, M.H.; Liu, X.; Lustig, N.; McKnight, A.; Nicholson, L.; Nielsen, D.; Nummy, K.; Ontalus, V.; Ouyang, C.; Ouyang, X.; Rausch, W.; Restaino, D.; Sheraw, C.; Sim, J.; Simon, A.; Standaert, T.; Sung, C.Y.; Tabakman, K.; Tian, C.; Vayshenker, A.; Wehella-Gamage, D.; Wong, R.C.; Yu, J.; Wu, S.; Chen, X.; Edelstein, D.; Grill, A.; Khare, M.; Li, Y.; Norum, J.; Sankaran, S.; Schepis, D.; Wachnik, R.; Wise, R.; Wann, C.; Ivers, T.; Agnello, P.; Waite, A.; Black, L.; Cheng, J.; Fisher, P.; Hargrove, M.; Kelling, M.; Prindle, C.; Pal, R.; Van Den Nieuwenhuizen, R.; Van Meer, H.; Werking, J.; Augur, R.; Brown, D.; Luning, S.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2006 International Electron Devices Meeting Technical Digest, IEDM. (Technical Digest - International Electron Devices Meeting, IEDM, 2006)
Conference
Khare, M.; Ku, S.H.; Donaton, R.A.; Greco, S.; Brodsky, C.; Chen, X.; Chou, A.; DellaGuardia, R.; Deshpande, S.; Doris, B.; Fung, S.K.H.; Gabor, A.; Gribelyuk, M.; Holmes, S.; Jamin, F.F.; Lai, W.L.; Lee, W.H.; Li, Y.; McFarland, P.; Mo, R.; Mittl, S.; Narasimha, S.; Nielsen, D.; Purtell, R.; Rausch, W.; Sankaran, S.; Snare, J.; Tsou, L.; Vayshenker, A.; Wagner, T.; Wehella-Gamage, D.; Wu, E.; Wu, S.; Yan, W.; Barth, E.; Ferguson, R.; Gilbert, P.; Schepis, D.; Sekiguchi, A.; Goldblatt, R.; Welser, J.; Muller, K.P.; Agnello, P.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2002, :407-410)
Periodical
Capodieci, Luigi; Cain, Jason P.; Ramadout, B.; Wehella-Gamage, D.; Staiger, T.; Moll, H.-P.; Neogi, T.-Guha
Proceedings of SPIE; April 2017, Vol. 10148 Issue: 1 p1014812-1014812-7
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[AR] Wehella-Gamage, D.
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