학술논문
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Conference
Su, C.-Y.; Armstrong, M.; Chugh, S.; El-tanani, M.; Greve, H.; Li, H.; Maksud, M.; Orr, B.; Perini, C.; Palmer, J.; Paulson, L.; Ramey, S.; Waldemer, J.; Yang, Y.; Young, D.
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020
Conference
Pelto, C.; Aggarwal, R.; Ahan, R.; Armstrong, M.; Bebek, M.; Blount, M.; Chowdhury, S.; Connor, C.; Debonis, T.; Dhayal, B.; Dougless, A.; Gokhale, S.; Javvaji, V.; Kim, G.; Kpetehoto, J.; Lin, C.; Ma, Y.; McPherson, G.; Mokler, S.; Perini, C.; Ramaswamy, R.; Sell, B.; Waldemer, J.; Wei, D.; Yang, Y.; Yaung, J.; Sabi, B.; Natarajan, S.; Chuah, J.; Jain, A.; Kamisetty, K.; Kuan, C.; Yang, Y.; Liu, G.; Subramaniam, R.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024. (Digest of Technical Papers - Symposium on VLSI Technology, 2024)
Conference
Butzen, N.; Krishnamurthy, H.; Yu, J.; Ahmed, Z.K.; Weng, S.; Ravichandran, K.; Ahangharnejhad, R.H.; Waldemer, J.; Pelto, C.; Tschanz, J.
In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference , 2024 IEEE International Solid-State Circuits Conference, ISSCC 2024. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 2024, :462-464)
Conference
Sell, B.; Bigwood, B.; Cha, S.; Chen, Z.; Dhage, P.; Fan, P.; Giraud-Carrier, M.; Kar, A.; Karl, E.; Ku, C.-J.; Kumar, R.; Lajoie, T.; Lee, H.-J.; Liu, G.; Liu, S.; Ma, Y.; Mudanai, S.; Nguyen, L.; Paulson, L.; Phoa, K.; Pierce, K.; Roy, A.; Russell, R.; Sandford, J.; Stoeger, J.; Stojanovic, N.; Sultana, A.; Waldemer, J.; Wan, J.; Xu, W.; Young, D.; Zhang, J.; Zhang, Y.; Bai, P.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.4.1-29.4.4 Dec, 2017
Conference
Yu, Q.; Kim, G.-S.; Garrett, J.; Thomson, D.; Dogiamis, G.; Ma, Y.; Waldemer, J.; Nam, Y.S.; Beltran, G.; Neeli, V.; Ravikumar, S.; Rami, S.; Pelto, C.; Karl, E.; Monroe, N.; Han, R.
In: IEEE MTT-S International Microwave Symposium Digest , 2022 IEEE/MTT-S International Microwave Symposium, IMS 2022. (IEEE MTT-S International Microwave Symposium Digest, 2022, 2022-June:325-328)
Conference
In: IEEE MTT-S International Microwave Symposium Digest , 2021 IEEE MTT-S International Microwave Symposium, IMS 2021. (IEEE MTT-S International Microwave Symposium Digest, 7 June 2021, 2021-June:34-37)
Conference
Yu, Q.; Rami, S.; Waldemer, J.; Ma, Y.; Neeli, V.; Garrett, J.; Liu, G.; Koo, J.; Marulanda, M.; Morarka, S.; Ravikumar, S.; Yeh, Y.-S.; Chou, J.; Brown, T.; Rane, T.; Nieva, C.; Ali, D.; Joglekar, S.; Armstrong, M.; Wahl, J.; Paulson, L.; Dogiamis, G.; Lee, H.-J.; Fu, H.; Sell, B.; Karl, E.; Zhang, Y.; Monroe, N.; Han, R.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2020 IEEE International Electron Devices Meeting, IEDM 2020. (Technical Digest - International Electron Devices Meeting, IEDM, 12 December 2020, 2020-December:17.4.1-17.4.4)
Conference
Sell, B.; Bigwood, B.; Cha, S.; Chen, Z.; Dhage, P.; Fan, P.; Giraud-Carrier, M.; Kar, A.; Karl, E.; Ku, C.-J.; Kumar, R.; Lajoie, T.; Lee, H.-J.; Liu, G.; Liu, S.; Ma, Y.; Mudanai, S.; Nguyen, L.; Paulson, L.; Phoa, K.; Pierce, K.; Roy, A.; Russell, R.; Sandford, J.; Stoeger, J.; Stojanovic, N.; Sultana, A.; Waldemer, J.; Wan, J.; Xu, W.; Zhang, J.; Zhang, Y.; Bai, P.; Young, D.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :29.4.1-29.4.4)
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[AR] Waldemer, J.
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