학술논문
'학술논문'
에서 검색결과 23건 | 목록
1~10
Conference
Weber, Olivier; Min, Doohong; Villaret, Alexandre; Park, Jinha; Lee, Ilmin; Vandenbossche, Eric; Kim, Dohun; Yun, Jiyoung; Park, Jinwoo; Lee, Minuk; Kang, Jinseok; Lee, Hyunjong; Choi, Youngju; Kim, Inhwan; Kim, Joochan; Kedar, Dhori; Janardan, Dhori Kedar; Haendler, Sebastien; Elghouli, Salim; Puget, Sophie; Bernicot, Christophe; Bernard, Emilie; Wacquant, Francois; Nimsgern, Fabien; Choi, Joonhyuk; Maeda, Shigenobu; Lee, Jongho; Arnaud, Franck
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :27.2.1-27.2.4 Dec, 2022
Conference
Min, Doohong; Park, Jinha; Weber, Olivier; Wacquant, Francois; Villaret, Alexandre; Vandenbossche, Eric; Arnaud, Franck; Bernard, Emilie; Elghouli, Salim; Boccaccio, Christian; Favennec, Laurent; Gonella, Roberto; Galvier, Jean; Yun, Jiyoung; Park, Jinwoo; Lee, Minuk; Yoon, Pyeongjun; Lee, Ilmin; Seo, Heaseok; Choi, Hoonsung; Oh, Changbong; Kang, Jinseok; Park, Sewan; Lee, Hyunjong; Choi, Youngju; Kim, Inwhan; Jo, Joohyun; Park, Yoonsoo; Park, Jinchan; Lee, Youngja; Jung, Jinhyeok; Lee, Juwon; Jang, Hana; Kang, Jihun; Kwon, Jisoo; Kim, Joochan; Maeda, Shigenobu; Hong, Youngki
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :13.1.1-13.1.4 Dec, 2021
Conference
Morillon, Dann; Masson, Pascal; Julien, Franck; Lorenzini, Philippe; Goy, Jerome; Pribat, Clement; Gourhant, Olivier; Kempf, Thibault; Ogier, Jean-Luc; Villaret, Alexandre; Ghezzi, Giada; Cherault, Nathalie; Niel, Stephan
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Conference
Morillon, Dann; Pribat, Clement; Julien, Franck; Cherault, Nathalie; Goy, Jerome; Gourhant, Olivier; Ogier, Jean-Luc; Masson, Pascal; Ghezzi, Giada; Kempf, Thibault; Delalleau, Julien; Villaret, Alexandre; Grenier, Jean-Christophe; Niel, Stephan
2017 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2017 IEEE International. :1-4 Oct, 2017
Report
Tang, Xiaohui; Reckinger, Nicolas; Bayot, Vincent; Krzeminski, Christophe; Dubois, Emmanuel; Villaret, Alexandre; Bensahel, Daniel
IEEE Transaction on Nanotechnology 5, 6 (2006) p. 649
Conference
Foussadier, Franck; Yesilada, Emek; Le Denmat, Jean-Christophe; Trouiller, Yorick; Farys, Vincent; Robert, Frédéric; Kerrien, Gurwan; Gardin, Christian; Perraud, Loic; Vautrin, Florent; Villaret, Alexandre; Martinelli, Catherine; Planchot, Jonathan; Di-Maria, Jean Luc; Saied, Mazen; Top, Mame Kouna
Proceedings of SPIE; Nov2009, Issue 1, p727416-727416-7, 7p
Academic Journal
Villaret, Alexandre; Ranica, Rosella; Malinge, Pierre; Martinet, Bertrand; Mazoyer, Pascale; Candelier, P.; Skotnicki, Thomas
IEEE Transactions on Electron Devices. Nov 2005, Vol. 52 Issue 11, p2447, 8 p.
Academic Journal
Puget, Sophie; Bossu, Germain; Masson, Pascal; Mazoyer, Pascale; Ranica, Rossella; Villaret, Alexandre; Lorenzini, Philippe; Portal, Jean-Michel; Rideau, Denis; Ghibaudo, Gérard; Bouchakour, Rachid; Jacquemod, Gilles; Skotnicki, Thomas
Periodical
Proceedings of SPIE; April 2013, Vol. 8683 Issue: 1 p86830E-86830E-12, 8596183p
Academic Journal
Tang, Xiaohui; Reckinger, Nicolas; Bayot, Vincent; Krzeminski, Christophe; Dubois, Emmanuel; Villaret, Alexandre; Bensahel, Daniel-Camille
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[AR] Villaret, Alexandre
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