학술논문
'학술논문'
에서 검색결과 23건 | 목록
1~10
Academic Journal
Rocha, L.G.; Biswas, D.; Verhoef, B.; Bampi, S.; Van Hoof, C.; Konijnenburg, M.; Verhelst, M.; Van Helleputte, N.
IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 14(4):715-726 Aug, 2020
Academic Journal
Biswas, D.; Everson, L.; Liu, M.; Panwar, M.; Verhoef, B.; Patki, S.; Kim, C.H.; Acharyya, A.; Van Hoof, C.; Konijnenburg, M.; Van Helleputte, N.
IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 13(2):282-291 Apr, 2019
Conference
Doevenspeck, J.; Garello, K.; Verhoef, B.; Degraeve, R.; Van Beek, S.; Crotti, D.; Yasin, F.; Couet, S.; Jayakumar, G.; Papistas, I. A; Debacker, P.; Lauwereins, R.; Dehaene, W.; Kar, G. S.; Cosemans, S.; Mallik, A.; Verkest, D.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Cosemans, S.; Verhoef, B.; Doevenspeck, J.; Papistas, I. A.; Catthoor, F.; Debacker, P.; Mallik, A.; Verkest, D.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :22.2.1-22.2.4 Dec, 2019
Conference
In: 2024 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2024 - Proceedings , 2024 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2024 - Proceedings. (2024 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2024 - Proceedings, 2024, :470-475)
Conference
Hager, P.A.; Moons, B.; Cosemans, S.; Papistas, I.A.; Rooseleer, B.; Loon, J.V.; Uytterhoeven, R.; Zaruba, F.; Koumousi, S.; Stanisavljevic, M.; MacH, S.; Mutsaards, S.; Aljameh, R.K.; Khov, G.H.; MacHiels, B.; Olar, C.; Psarras, A.; Geursen, S.; Vermeeren, J.; Lu, Y.; Maringanti, A.; Ameta, D.; Katselas, L.; Hutter, N.; Schmuck, M.; Sivadas, S.; Sharma, K.; Oliveira, M.; Aerne, R.; Sharma, N.; Soni, T.; Bussolino, B.; Pesut, D.; Pallaro, M.; Podlesnii, A.; Lyrakis, A.; Ruffiner, Y.; Dazzi, M.; Thiele, J.; Goetschalckx, K.; Bruschi, N.; Doevenspeck, J.; Verhoef, B.; Linz, S.; Garcea, G.; Ferguson, J.; Koltsidas, I.; Eleftheriou, E.
In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference , 2024 IEEE International Solid-State Circuits Conference, ISSCC 2024. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 2024, :212-214)
Conference
Pasquinelli, V.; Martarelli, M.; Paone, N.; Castellini, P.; Montalto, L.; Alexopoulos, K.; Nikolakis, N.; Kamp, W.V.D.; Verhoef, B.
In: 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings , 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings. (2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings, 2023, :130-135)
Conference
Medici, V.; Martarelli, M.; Paone, N.; Pandarese, G.; Van De Kamp, W.; Verhoef, B.; Sipsas, K.; Broechler, R.; Besada, L.B.; Alexopoulos, K.; Nikolakis, N.
In: 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings , 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings. (2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings, 2023, :439-444)
Conference
Discepolo, S.; Martarelli, M.; Paone, N.; Castellini, P.; Kamp, W.V.D.; Verhoef, B.; Nikolakis, N.; Alexopoulos, K.
In: 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings , 2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings. (2023 IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 - Proceedings, 2023, :136-141)
Academic Journal
In: Boundary-Layer Meteorology . (Boundary-Layer Meteorology, June 2013, 147(3):443-468)
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[AR] Verhoef, B.
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