학술논문
'학술논문'
에서 검색결과 20건 | 목록
1~10
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :18-28 2000
Academic Journal
Mergens, M.P.J.; Russ, C.C.; Verhaege, K.G.; Armer, J.; Jozwiak, P.C.; Mohn, R.P.; Keppens, B.; Trinh, C.S.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 5(3):532-542 Sep, 2005
Conference
Mergens, M.P.J.; Russ, C.C.; Verhaege, K.G.; Armer, J.; Jozwiak, P.C.; Mohn, R.; Keppens, B.; Trinh, C.S.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :21.3.1-21.3.4 2003
Conference
2004 Electrical Overstress/Electrostatic Discharge Symposium; 2004, p1-10, 10p
Conference
Keppens, B.; Mergens, M.P.J.; Armer, J.; Jozwiak, P.C.; Taylor, G.; Mohn, R.; Cong Son Trinh; Russ, C.C.; Verhaege, K.G.; De Ranter, F.
2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-9, 9p
Conference
2001 Electrical Overstress/Electrostatic Discharge Symposium; 2001, p1-11, 11p
Conference
2001 Electrical Overstress/Electrostatic Discharge Symposium; 2001, p22-31, 10p
Academic Journal
Mohn, R.P.; Mergens, M.P.J.; Verhaege, K.G.; Keppens, B.; Russ, C.C.; Armer, J.; Jozwiak, P.C.; Trinh, C.S.
In: IEEE Transactions on Device and Materials Reliability . (IEEE Transactions on Device and Materials Reliability, September 2005, 5(3):532-541)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, January 2002, 42(1):3-13)
Conference
In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings , Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2002 - Proceedings. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2002, 2002-January:10-17)
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제한된 항목
[AR] Verhaege, K.G.
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