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Analyzing Transient Phenomena in the Time Domain Using the Feature Selective Validation (FSV) Method
Academic Journal
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 56(4):825-834 Aug, 2014
Academic Journal
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 56(4):808-816 Aug, 2014
Academic Journal
Azpurua, M. A.; Paez, E.; Rojas-Mora, J.; Ventosa, O.; Silva, F.; Zhang, G.; Duffy, A. P.; Jauregui, R.
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 56(4):800-807 Aug, 2014
Academic Journal
In: IET Science, Measurement and Technology . (IET Science, Measurement and Technology, 2013, 7(3):151-156)
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[AR] Ventosa, O.
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