학술논문
'학술논문'
에서 검색결과 93건 | 목록
1~10
Conference
Addepalli, Hari; Pomeranz, Irith; Amyeen, Enamul; Natarajan, Suriyaprakash; Sinha, Arani; Venkataraman, Srikanth
2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :120-125 Nov, 2022
Conference
2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-6 Apr, 2019
Conference
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. :1022-1027 Mar, 2019
Conference
2018 IEEE 23rd European Test Symposium (ETS) Test Symposium (ETS), 2018 IEEE 23rd European. :1-6 May, 2018
Conference
2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-9 Oct, 2017
Conference
2016 IEEE 25th Asian Test Symposium (ATS) Asian Test Symposium, 2016 IEEE 25th Asian Test Symposium (ATS), 2016 IEEE 25th. :138-143 Nov, 2016
Conference
Amyeen, M. Enamul; Kim, Dongok; Chandrasekar, Maheshwar; Noman, Mohammad; Venkataraman, Srikanth; Jain, Anurag; Goel, Neha; Sharma, Ramesh
2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-10 Nov, 2016
Conference
Bodhe, Shraddha; Amyeen, M. Enamul; Galendez, Clariza; Mooers, Houston; Pomeranz, Irith; Venkataraman, Srikanth
2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-6 Apr, 2016
Conference
2011 IEEE International Test Conference Test Conference (ITC), 2011 IEEE International. :1-10 Sep, 2011
Conference
2010 28th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2010 28th. :206-211 Apr, 2010
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제한된 항목
[AR] Venkataraman, Srikanth
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