학술논문
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Academic Journal
In Journal of Crystal Growth 1 February 2020 531
Academic Journal
In: Journal of Magnetic Resonance . (Journal of Magnetic Resonance, February 2020, 311)
Academic Journal
In: Tsvetnye Metally . (Tsvetnye Metally, 2020, 2020(9):23-30)
Conference
Grigoriev, D.N.; Akhmetshin, R.R.; Beschastnov, P.M.; Fedorenko, V.E.; Pyata, E.E.; Smakhtin, V.P.; Yudin, Yu.V.; Shlegel, V.N.; Vasiliev, Y.V.
Proceedings of 1994 IEEE Nuclear Science Symposium - NSS'94 Nuclear science and medical imaging Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record. 2:533-537 vol.2 1994
Academic Journal
Di Marco, A.; Belli, P.; Bernabei, R.; Cerulli, R.; Merlo, V.; Montecchia, F.; Barabash, A.S.; Konovalov, S.I.; Umatov, V.I.; Boiko, R.S.; Chernyak, D.M.; Danevich, F.A.; Kasperovych, D.V.; Kobychev, V.V.; Polischuk, O.G.; Poda, D.V.; Tretyak, V.I.; Zarytskyy, M.M.; Brudanin, V.B.; Cappella, F.; Incicchitti, A.; Caracciolo, V.; Laubenstein, M.; Shlegel, V.N.; Vasiliev, Y.V.
In: Universe . (Universe, December 2018, 4(12))
Academic Journal
Barabash, A.S.; Konovalov, S.I.; Umatov, V.I.; Belli, P.; Bernabei, R.; Cerulli, R.; D'Angelo, S.; Cappella, F.; Incicchitti, A.; Caracciolo, V.; Laubenstein, M.; Chernyak, D.M.; Danevich, F.A.; Kasperovych, D.V.; Kobychev, V.V.; Poda, D.V.; Polischuk, O.G.; Tretyak, V.I.; Shlegel, V.N.; Vasiliev, Y.V.
In: Physical Review D . (Physical Review D, 1 November 2018, 98(9))
Academic Journal
Armengaud, E.; Gros, M.; Hervé, S.; Magnier, P.; Navick, X.-F.; Nones, C.; Paul, B.; Penichot, Y.; Zolotarova, A.S.; Augier, C.; Billard, J.; Cazes, A.; Charlieux, F.; Jesus, M.D.; Gascon, J.; Juillard, A.; Queguiner, E.; Sanglard, V.; Vagneron, L.; Barabash, A.S.; Konovalov, S.I.; Umatov, V.I.; Beeman, J.W.; Hehn, L.; Bekker, T.B.; Bellini, F.; Ferroni, F.; Cardani, L.; Casali, N.; Dafinei, I.; Tomei, C.; Vignati, M.; Benoît, A.; Camus, P.; Bergé, L.; Broniatowski, A.; Chapellier, M.; Dumoulin, L.; Giuliani, A.; Humbert, V.; Sueur, H.L.; Mancuso, M.; de Marcillac, P.; Marnieros, S.; Marrache-Kikuchi, C.; Novati, V.; Olivieri, E.; Plantevin, O.; Poda, D.V.; Bergmann, T.; Kleifges, M.; Tcherniakhovski, D.; Weber, M.; Boiko, R.S.; Chernyak, D.M.; Danevich, F.A.; Kobychev, V.V.; Nikolaichuk, M.O.; Tretyak, V.I.; Foerster, N.; Kozlov, V.; Scorza, S.; Brudanin, V.; Rozov, S.; Yakushev, E.; Capelli, S.; Gironi, L.; Pavan, M.; Pessina, G.; de Combarieu, M.; Pari, P.; Coron, N.; Redon, T.; Devoyon, L.; Koskas, F.; Strazzer, O.; Domizio, S.D.; Eitel, K.; Siebenborn, B.; Enss, C.; Fleischmann, A.; Gastaldo, L.; Grigorieva, V.D.; Ivannikova, N.V.; Ivanov, I.M.; Makarov, E.P.; Shlegel, V.N.; Vasiliev, Y.V.; Jin, Y.; Kraus, H.; Kudryavtsev, V.A.; Laubenstein, M.; Nagorny, S.; Pagnanini, L.; Pattavina, L.; Pirro, S.; Rusconi, C.; Schäffner, K.; Loidl, M.; Rodrigues, M.; Piperno, G.; Velázquez, M.
In: European Physical Journal C . (European Physical Journal C, 1 November 2017, 77(11))
Academic Journal
Ishikawa, T.; Fujimura, H.; Hashimoto, R.; Kaida, S.; Kitazawa, R.; Nakamura, A.; Shimizu, H.; Suzuki, K.; Takahashi, S.; Tsuchikawa, Y.; Yamazaki, H.; Grigoriev, D.N.; Kuznetsov, G.N.; Vasiliev, Y.V.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment . (Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 21 November 2016, 837:109-122)
Conference
In: Journal of Physics: Conference Series , II International Scientific Conference on Metrological Support of Innovative Technologies, ICMSIT II-2021 - Engineering and Innovative Technologies. (Journal of Physics: Conference Series, 18 May 2021, 1889(4))
Academic Journal
Armengaud, E.; De Boissière, T.; Fourches, N.; Gerbier, G.; Gray, D.; Gros, M.; Hervé, S.; Magnier, P.; Navick, X.-F.; Nones, C.; Paul, B.; Penichot, Y.; Arnaud, Q.; Augier, C.; Benoît, A.; Cazes, A.; Charlieux, F.; Jesus, M.D.; Gascon, J.; Juillard, A.; Kéfélian, C.; Sanglard, V.; Vagneron, L.; Benoît, A.; Camus, P.; Bergé, L.; Broniatowski, A.; Chapellier, M.; Chernyak, D.M.; Drillien, A.-A.; Dumoulin, L.; Giuliani, A.; Humbert, V.; Sueur, H.L.; Mancuso, M.; De Marcillac, P.; Marnieros, S.; Marrache-Kikuchi, C.; Olivieri, E.; Piro, M.C.; Plantevin, O.; Poda, D.V.; Tenconi, M.; Boiko, R.S.; Danevich, F.A.; Kobychev, V.V.; Tretyak, V.I.; Bergmann, T.; Kleifges, M.; Menshikov, A.; Tcherniakhovski, D.; Weber, M.; Blümer, J.; Foerster, N.; Heuermann, G.; Kluck, H.; Scorza, S.; Eitel, K.; Hehn, L.; Kozlov, V.; Schmidt, B.; Siebenborn, B.; Walker, R.J.; Brudanin, V.; Filosofov, D.; Rozov, S.; Yakushev, E.; Coron, N.; Redon, T.; Torres, L.; Coulter, P.; Henry, S.; Kraus, H.; Zhang, X.; Decourt, R.; Velazquez, M.; Viraphong, O.; Devoyon, L.; Koskas, F.; Strazzer, O.; Enss, C.; Fleischmann, A.; Gastaldo, L.; Pessina, G.; Ivanov, I.M.; Makarov, E.P.; Nasonov, S.G.; Shlegel, V.N.; Vasiliev, Y.V.; Kudryavtsev, V.A.; Robinson, M.; Loidl, M.; Rodrigues, M.; Pari, P.; Zhdankov, V.N.
In: Journal of Instrumentation . (Journal of Instrumentation, 1 May 2015, 10(5))
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[AR] Vasiliev, Y.V.
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