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발행년	- (예 : 2010-2015)

Efficient path planning for automated guided vehicles using A* (Astar) algorithm incorporating turning costs in search heuristic

Academic Journal

Fransen, K.; van Eekelen, J.

In: International Journal of Production Research. (International Journal of Production Research, 2023, 61(3):707-725)

EBSCOHost PDF Full Text (ECC - 개별구독 전자저널) Web of Science JCR 저널정보 Scopus Find it@PNU

Validation research of the Vrije Universiteit shows usefulness: Icons provide better understanding of the effects of drugs

Academic Journal

Salarbux, F.; Van Eekelen, J.; Dubbeld, L.; Groenendijk, C.; Maartense, R.

In: Pharmaceutisch Weekblad. (Pharmaceutisch Weekblad, 1 September 2017, 152(35):20-21)

Scopus Find it@PNU

Full Field Nanoimprint on Mask Aligners Using Substrate Conformal Imprint Lithography Technique.

Academic Journal

Ran Ji; Krüger, A.; Hornung, M.; Verschuuren, M.; van de Laar, R.; van Eekelen, J.

Acta Physica Polonica: A. Dec2009 Supplement, Vol. 116, pS.187-S.189. 3p. 2 Color Photographs, 1 Black and White Photograph.

EBSCOHost PDF Web of Science JCR 저널정보 Scopus Find it@PNU

UV enhanced substrate conformal imprint lithography (UV-SCIL) technique for photonic crystals patterning in LED manufacturing

Academic Journal

Ji, R.; Hornung, M.; Verschuuren, M.A.; van de Laar, R.; van Eekelen, J.; Plachetka, U.; Moeller, M.; Moormann, C.

In: Microelectronic Engineering. (Microelectronic Engineering, May 2010, 87(5-8):963-967)

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

Measurement of total fructan in foods by enzymatic/spectrophotometric method: Collaborative study

Academic Journal

McCleary, B.V.; Murphy, A.; Mugford, D.C.; Andersen, R.; Ashton, J.; Blakeney, T.; Boorman, J.; Duncan, K.; Farnell, P.; Fulford, A.; Hermans, M.; King, D.; Li, B.; McNaught, K.; Müller, M.; Nuavia, J.; Pontis, H.; Puebla, A.; Salelno, G.; Salman, H.; Solah, V.; Sørensen, A.; Suter, D.; Van Eekelen, J.; Van Der Waal, W.; Walker, R.; Wo, C.

In: Journal of AOAC International. (Journal of AOAC International, March/April 2000, 83(2):356-364)

Full Text (Oxford University Press) Full Text (OUP Near Archive) Web of Science JCR 저널정보 Scopus Find it@PNU

SCIL - A new method for large area NIL

Conference

Weixlberger, J.; Van Eekelen, J.; Verschuuren, M.

In: Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008, Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. (Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008, 2008, 1:556-558)

Scopus Find it@PNU

Full Field Nanoimprint on Mask Aligners Using Substrate Conformal Imprint Lithography Technique

Academic Journal

Ji, Ran; Krueger, A.; Hornung, M.; Verschuuren, M.; van de Laar, R.; van Eekelen, J.

ACTA PHYSICA POLONICA A; DEC 2009, 116 pS187-pS189, 3p. Supplement: S

EBSCOHost PDF Web of Science JCR 저널정보 Find it@PNU

Load Forming Logic for Load Carrier Loading.

Periodical

van Eekelen, J.

Research Disclosure; Jul2013, Issue 591, p922-922, 1p

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