학술논문
'학술논문'
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1~10
Conference
Tyaginov, S.E.; Bury, E.; Grill, A.; Yu, Z.; Makarov, A.; De Keersgieter, A.; Vexler, M.I.; Vandemaele, M.; Wang, R.; Spessot, A.; Chasin, A.; Kaczer, B.
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023
Academic Journal
In Current Applied Physics February 2015 15(2):78-83
Conference
Tyaginov, S.E.; Jech, M.; Rzepa, G.; Grill, A.; El-Sayed, A.-M.; Pobegen, G.; Makarov, A.; Grasser, T.
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-5 Oct, 2018
Academic Journal
In Materials Science in Semiconductor Processing 2010 13(5):405-410
Academic Journal
In Thin Solid Films 2008 516(23):8740-8744
Academic Journal
Sokolov, N.S.; Grekhov, I.V.; Ikeda, S.; Kaveev, A.K.; Krupin, A.V.; Saiki, K.; Tsutsui, K.; Tyaginov, S.E.; Vexler, M.I.
In Microelectronic Engineering 2007 84(9):2247-2250
On the effect of interface traps on the carrier distribution function during hot-carrier degradation
Conference
2016 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2016 IEEE International. :95-98 2016
Academic Journal
Vexler, M.I.; El Hdiy, A.; Grgec, D.; Tyaginov, S.E.; Khlil, R.; Meinerzhagen, B.; Shulekin, A.F.; Grekhov, I.V.
In Microelectronics Journal February 2006 37(2):114-120
Academic Journal
In Microelectronic Engineering 2006 83(2):376-380
Academic Journal
In Microelectronics Reliability 2006 46(7):1035-1041
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제한된 항목
[AR] Tyaginov, S.E.
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