학술논문
'학술논문'
에서 검색결과 112건 | 목록
1~10
Conference
Moosa, M.; Haggag, A.; Liu, N.; Kalpat, S.; Kuffler, M.; Menke, D.; Abramowitz, P.; Ramon, M.E.; Tseng, H.H.; Luo, T.Y.; Lim, S.; Grudowski, P.; Jiang, J.; Min, B.W.; Weintraub, C.; Chen, J.; Wong, S.; Paquette, C.; Anderson, G.; Tobin, P.J.; White, B.E., Jr.; Mendicino, M.
2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :129-133 2005
Conference
Samavedam, S.B.; La, L.B.; Smith, J.; Dakshina-Murthy, S.; Luckowski, E.; Schaeffer, J.; Zavala, M.; Martin, R.; Dhandapani, V.; Triyoso, D.; Tseng, H.H.; Tobin, P.J.; Gilmer, D.C.; Hobbs, C.; Taylor, W.J.; Grant, J.M.; Hegde, R.I.; Mogab, J.; Thomas, C.; Abramowitz, P.; Moosa, M.; Conner, J.; Jiang, J.; Arunachalarn, V.; Sadd, M.; Nguyen, B.-Y.; White, B.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :433-436 2002
Academic Journal
In: Journal of Electronic Commerce Research . (Journal of Electronic Commerce Research, February 2021, 22(1):4-21)
Conference
1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on. :44-48 1995
Conference
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :191-193 2000
Conference
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) Integrated reliability workshop Integrated Reliability Workshop Final Report, 1999. IEEE International. :111-113 1999
Conference
IEEE Conference on Nuclear Science Symposium and Medical Imaging Nuclear Science Symposium and Medical Imaging Conference, 1992., Conference Record of the 1992 IEEE. :70-72 vol.1 1992
Conference
Samavedam, S.B.; Tseng, H.H.; Tobin, P.J.; Mogab, J.; Dakshina-Murthy, S.; La, L.B.; Smith, J.; Schaeffer, J.; Zavala, M.; Martin, R.; Nguyen, B.-Y.; Hebert, L.; Adetutu, O.; Dhandapani, V.; Luo, T.-Y.; Garcia, R.; Abramowitz, P.; Moosa, M.; Gilmer, D.C.; Hobbs, C.; Taylor, W.J.; Grant, J.M.; Hegde, R.; Bagchi, S.; Luckowski, E.; Arunachalam, V.; Azrak, M.
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :24-25 2002
Conference
Samavedam, S.B.; La, L.B.; Tobin, P.J.; White, B.; Hobbs, C.; Fonseca, L.R.C.; Demkov, A.A.; Schaeffer, J.; Luckowski, E.; Martinez, A.; Raymond, M.; Triyoso, D.; Roan, D.; Dhandapani, V.; Garcia, R.; Anderson, S.G.H.; Moore, K.; Tseng, H.H.; Capasso, C.; Adetutu, O.; Gilmer, D.C.; Taylor, W.J.; Hegde, R.; Grant, J.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :13.1.1-13.1.4 2003
Academic Journal
In: Classical and Quantum Gravity . (Classical and Quantum Gravity, 21 September 2014, 31(18))
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제한된 항목
[AR] Tseng, H.H.
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