학술논문
'학술논문'
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Report
IEEE Transactions on Nuclear Science, vol. 61, no. 4, pp. 1849-1855, Aug. 2014
Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment
Academic Journal
In Microelectronics Reliability July 2020 110
Conference
2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS) Design of Circuits and Integrated Circuits (DCIS), 2022 37th Conference on. :1-6 Nov, 2022
Academic Journal
Nature Communications; 9/11/2024, Vol. 15 Issue 1, p1-11, 11p
Academic Journal
Ukleja, Marta; Kricks, Lara; Torrens, Gabriel; Peschiera, Ilaria; Rodrigues-Lopes, Ines; Krupka, Marcin; García-Fernández, Julia; Melero, Roberto; del Campo, Rosa; Eulalio, Ana; Mateus, André; López-Bravo, María; Rico, Ana I.; Cava, Felipe; Lopez, Daniel
Nature Communications; 7/3/2024, Vol. 15 Issue 1, p1-21, 21p
Academic Journal
In Microelectronics Reliability October 2016 65:280-288
Academic Journal
In Solid State Electronics September 2015 111:104-110
Academic Journal
Espaillat, Akbar; Alvarez, Laura; Torrens, Gabriel; ter Beek, Josy; Miguel-Ruano, Vega; Irazoki, Oihane; Gago, Federico; Hermoso, Juan A.; Berntsson, Ronnie P-A.; Cava, Felipe
Nature Communications; 2/13/2024, Vol. 15 Issue 1, p1-17, 17p
Academic Journal
Escobar-Salom, Maria; Barcelo, Isabel Maria; Jordana-Lluch, Elena; Torrens, Gabriel; Oliver, Antonio; Juan, Carlos
FEMS Microbiology Reviews. March 2023, Vol. 47 Issue 2, p1d, 21 p.
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[AR] Torrens, Gabriel
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