학술논문
'학술논문'
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Academic Journal
Teves, S.; Biermann, T.; Ziebehl, A.; Xia, P.; Lachmayer, R.; Eckert, J.G.; Bigall, N.C.; Hill, O.; Wollweber, M.; Ripken, T.
In: Additive Manufacturing Letters . (Additive Manufacturing Letters, July 2024, 10)
Academic Journal
In: Applied Optics . (Applied Optics, 20 October 2023, 62(30):7895-7903)
Academic Journal
Agudelo, I.J.; Cogoi, L.; Filip, R.; Wagner, M.L.; Ricco, R.A.; Schiariti Lampropulos, V.E.; Carballo, M.A.; Lopez Nigro, M.M.; Teves, S.
In: Phytomedicine Plus . (Phytomedicine Plus, November 2021, 1(4))
Academic Journal
De Volder, A.L.; Teves, S.; Breglia, N.; Degrossi, J.; Isasmendi, A.; Pinheiro, J.L.; Hernandez, C.; Ibarra, L.; Vazquez, M.; Herrera, T.
In: International Microbiology . (International Microbiology, May 2021, 24(2):157-167)
Academic Journal
In: Gesundheitswesen . (Gesundheitswesen, 1 November 2020, 82(11):821-828)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Measurement Systems for Industrial Inspection XIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12618)
Periodical
De Volder, A. López; Teves, S.; Isasmendi, A.; Pinheiro, J. L.; Ibarra, L.; Breglia, N.; Herrera, T.; Vazquez, M.; Hernandez, C.; Degrossi, José
International Microbiology; May 2021, Vol. 24 Issue: 2 p157-167, 11p
Academic Journal
Academic Journal
Conference
In: 26th ACM International Systems and Software Product Line Conference, SPLC 2022 - Proceedings , 26th ACM International Systems and Software Product Line Conference, SPLC 2022 - Proceedings. (26th ACM International Systems and Software Product Line Conference, SPLC 2022 - Proceedings, 12 September 2022, B:237-244)
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[AR] Teves, S.
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