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Academic Journal
Delcourt, D.; Saito, Y.; Illiano, J.-M.; Krupp, N.; Berthelier, J.-J.; Fontaine, D.; Fraenz, M.; Leblanc, F.; Fischer, H.; Yokota, S.; Michalik, H.; Godefroy, M.; Saint-Jacques, E.; Techer, J.-D.; Fiethe, B.; Covinhes, J.; Gastou, J.; Attia, D.
In Advances in Space Research 2009 43(5):869-874
Academic Journal
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 59(5):2580-2586 Oct, 2012
Academic Journal
Owen, C.J.; Al Janabi, K.; Brockley-Blatt, C.; Hancock, B.; Kataria, D.; Lewis, G.; Mayall, A.; Rousseau, A.; Spencer, A.; Verscharen, D.; Anekallu, C.; Coker, J.; Darnley, R.; Davies, D.; Davison, G.; Fazakerley, A.; Gradone, S.; Hailey, M.; Hunt, T.; Lawrenson, A.; Malpus, A.; Phillips, I.; Rees, K.; Ruane, K.; Rust, D.; Varsani, A.; Watson, G.; Wheeler, P.; Willis, G.; Winter, B.; Yardley, J.; Bruno, R.; Demarco, R.; D'Amicis, R.; Marcucci, F.; Livi, S.; Allegrini, F.; Ford, J.; Loeffler, C.; Ogasawara, K.; Persyn, S.; Phillips, M.; Trevino, J.; Bland, P.; Brysch, M.; De Los Santos, A.; Dirks, G.; Edlund, E.; Ferris, M.; Gibson, W.; Johnson, M.; Lockhart, W.; Myers, S.; Nguyen, T.; Stange, J.; Taylor, T.; Thibodeaux, R.; Urdiales, C.; Louarn, P.; Amoros, C.; Baruah, R.; Barthe, A.; Bordon, S.; Fedorov, A.; Marty, W.; Mathon, R.; Penou, E.; Petiot, M.; Rouillard, A.P.; Rubiella, J.; Seran, H.; André, N.; Dandouras, I.; Devoto, P.; Fruit, G.; Garat, C.; Génot, V.; Jacquey, C.; Lavraud, B.; Mazelle, C.; Sauvaud, J.A.; Terrier, G.; Berthomier, M.; Leblanc, F.; Techer, J.-D.; Brysbaert, C.; Fratter, I.; Capuano, G.; Ascolese, R.; Calvanese, R.; Monti, F.; Collier, M.; Chornay, D.; Collinson, G.; Stubbs, T.; Fortunato, V.; Amoruso, L.; Galvin, A.B.; Heirtzler, D.; Kistler, L.; Bancroft, C.; Frost, C.; Popecki, M.; Lepri, S.T.; Raines, J.M.; Thomas, J.W.; Arnett, K.L.; Clemens, S.; Gilbert, J.A.; Rogacki, S.A.; Stakhiv, M.O.; Mele, G.; Alapide, A.; De Giosa, V.; Orlandi, M.; Arciuli, V.; Pacros, A.; Přech, L.; Reden, M.; ÄŒ Ermák, I.; Horbury, T.S.; Maksimovic, M.; Rodriguez-Pacheco, J.; Castronuovo, M.; Salatti, M.; Walsh, A.P.; Zouganelis, I.; Wimmer-Schweingruber, R.F.; Wurz, P.
In: Astronomy and Astrophysics . (Astronomy and Astrophysics, 1 October 2020, 642)
Academic Journal
Saito, Y.; Takashima, T.; Asamura, K.; Nishino, M.N.; Shinohara, I.; Hasegawa, H.; Mitani, T.; Fujimoto, M.; Delcourt, D.; Leblanc, F.; Katra, B.; Illiano, J.-M.; Techer, J.-D.; Fontaine, D.; Hirahara, M.; Miyoshi, Y.; Barabash, S.; Wieser, M.; Futaana, Y.; Shimoyama, M.; Andersson, H.; Karlsson, S.; Holmström, M.; André, N.; Sauvaud, J.-A.; Louarn, P.; Lavraud, B.; Génot, V.; Mazelle, C.; Dandouras, I.; Jacquey, C.; Aoustin, C.; Fedorov, A.; Le Comte, E.; Lee, Q.-M.; Médale, J.-L.; Penou, E.; Petiot, M.; Rouzaud, J.; Séran, H.-C.; Verdeil, C.; Yokota, S.; Oka, M.; Harada, Y.; Barthe, A.; Cadu, A.; Frezoul, A.-M.; Garat, C.; Moirin, D.; Peyre, G.; Nĕmec̆ek, Z.; S̆afránková, J.; Marcucci, M.F.; Bruno, R.; Consolini, G.; Miyake, W.; Seki, K.; Hoshino, M.; Keika, K.; Coates, A.J.; Berthelier, J.-J.; Fraenz, M.; Fischer, H.; Krupp, N.; Woch, J.; Bührke, U.; Fiethe, B.; Michalik, H.; Matsumoto, H.; Yanagimachi, T.; Zong, Q.; Wurz, P.; Kazama, Y.; Ip, W.-H.; Terada, N.
In: Space Science Reviews . (Space Science Reviews, August 2021, 217(5))
Conference
Lavraud, B.; Cara, A.; Sauvaud, J.-A.; Mathon, R.; Camus, T.; Chassela, O.; Seran, H.-C.; Devoto, P.; Fedorov, A.; Rouzaud, J.; Payan, D.; Ballot, Y.; Tap, H.; Bernal, O.; Berthomier, M.; Techer, J.-D.; Rubiella-Romeo, J.; Zély, D.; Galinier, S.; Bruno, D.
In: Proceedings of 2019 ESA Workshop on Aerospace EMC, Aerospace EMC 2019 , Proceedings of 2019 ESA Workshop on Aerospace EMC, Aerospace EMC 2019. (Proceedings of 2019 ESA Workshop on Aerospace EMC, Aerospace EMC 2019, May 2019)
Conference
In: 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings , 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings. (2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings, 2012, :2454-2457)
Book
In: Vlsi-Soc: From Systems To Silicon: Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth . (IFIP International Federation for Information Processing, 2007, 240:317-330)
Conference
In: SBCCI 2005 - 18th Symposium on Integrated Circuits and Systems Design , SBCCI 2005 - 18th Symposium on Integrated Circuits and Systems Design. (SBCCI 2005 - 18th Symposium on Integrated Circuits and Systems Design, 2005, :115-120)
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[AR] Techer, J.-D.
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