학술논문
'학술논문'
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1~10
Academic Journal
Modha, D.S.; Akopyan, F.; Andreopoulos, A.; Appuswamy, R.; Arthur, J.V.; Cassidy, A.S.; Datta, P.; DeBole, M.V.; Esser, S.K.; Otero, C.O.; Sawada, J.; Taba, B.; Amir, A.; Bablani, D.; Carlson, P.J.; Flickner, M.D.; Gandhasri, R.; Garreau, G.J.; Ito, M.; Klamo, J.L.; Kusnitz, J.A.; McClatchey, N.J.; McKinstry, J.L.; Nakamura, Y.; Nayak, T.K.; Risk, W.P.; Schleupen, K.; Shaw, B.; Sivagnaname, J.; Smith, D.F.; Terrizzano, I.; Ueda, T.
In: Science . (Science, 20 October 2023, 382(6668):329-335)
Academic Journal
Gallego, G.; Delbruck, T.; Orchard, G.; Bartolozzi, C.; Taba, B.; Censi, A.; Leutenegger, S.; Davison, A.J.; Conradt, J.; Daniilidis, K.; Scaramuzza, D.
IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 44(1):154-180 Jan, 2022
Conference
Amir, A.; Taba, B.; Berg, D.; Melano, T.; McKinstry, J.; Di Nolfo, C.; Nayak, T.; Andreopoulos, A.; Garreau, G.; Mendoza, M.; Kusnitz, J.; Debole, M.; Esser, S.; Delbruck, T.; Flickner, M.; Modha, D.
2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2017 IEEE Conference on. :7388-7397 Jul, 2017
Academic Journal
DeBole, M.; Taba, B.; Amir, A.; Akopyan, F.; Andreopoulos, A.; Risk, W.; Kusnitz, J.; Ortega Otero, C.; Nayak, T.; Appuswamy, R.; Carlson, P.; Cassidy, A.; Datta, P.; Esser, S.; Garreau, G.; Holland, K.; Lekuch, S.; Mastro, M.; McKinstry, J.; di Nolfo, C.; Paulovicks, B.; Sawada, J.; Schleupen, K.; Shaw, B.; Klamo, J.; Flickner, M.; Arthur, J.; Modha, D.
Computer. 52(5):20-29 May, 2019
Conference
Sawada, J.; Akopyan, F.; Cassidy, A.S.; Taba, B.; Debole, M.V.; Datta, P.; Alvarez-Icaza, R.; Amir, A.; Arthur, J.V.; Andreopoulos, A.; Appuswamy, R.; Baier, H.; Barch, D.; Berg, D.J.; Di Nolfo, C.; Esser, S.K.; Flickner, M.; Horvath, T.A.; Jackson, B.L.; Kusnitz, J.; Lekuch, S.; Mastro, M.; Melano, T.; Merolla, P.A.; Millman, S.E.; Nayak, T.K.; Pass, N.; Penner, H.E.; Risk, W.P.; Schleupen, K.; Shaw, B.; Wu, H.; Giera, B.; Moody, A.T.; Mundhenk, N.; Van Essen, B.C.; Wang, E.X.; Widemann, D.P.; Wu, Q.; Murphy, W.E.; Infantolino, J.K.; Ross, J.A.; Shires, D.R.; Vindiola, M.M.; Namburu, R.; Modha, D.S.
SC16: International Conference for High Performance Computing, Networking, Storage and Analysis SC High Performance Computing, Networking, Storage and Analysis, SC16: International Conference for. :130-141 Nov, 2016
Conference
Cassidy, A.S.; Arthur, J.V.; Akopyan, F.; Andreopoulos, A.; Appuswamy, R.; Datta, P.; Debole, M.V.; Esser, S.K.; Otero, C.O.; Sawada, J.; Taba, B.; Amir, A.; Bablani, D.; Carlson, P.J.; Flickner, M.D.; Gandhasri, R.; Garreau, G.J.; Ito, M.; Klamo, J.L.; Kusnitz, J.A.; McClatchey, N.J.; McKinstry, J.L.; Nakamura, Y.; Nayak, T.K.; Risk, W.P.; Schleupen, K.; Shaw, B.; Sivagnaname, J.; Smith, D.F.; Terrizzano, I.; Ueda, T.; Modha, D.
In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference , 2024 IEEE International Solid-State Circuits Conference, ISSCC 2024. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference, 2024, :214-215)
Conference
Modha, D.S.; Akopyan, F.; Andreopoulos, A.; Appuswamy, R.; Arthur, J.V.; Cassidy, A.S.; Datta, P.; Debole, M.V.; Esser, S.K.; Otero, C.O.; Sawada, J.; Taba, B.; Amir, A.; Bablani, D.; Carlson, P.J.; Flickner, M.D.; Gandhasri, R.; Garreau, G.J.; Ito, M.; Klamo, J.L.; Kusnitz, J.A.; Mcclatchey, N.J.; Mckinstry, J.L.; Nakamura, Y.; Nayak, T.K.; Risk, W.P.; Schleupen, K.; Shaw, B.; Sivagnaname, J.; Smith, D.F.; Terrizzano, I.; Ueda, T.
In: 2023 IEEE Hot Chips 35 Symposium, HCS 2023 , 2023 IEEE Hot Chips 35 Symposium, HCS 2023. (2023 IEEE Hot Chips 35 Symposium, HCS 2023, 2023)
Academic Journal
Akopyan, F.; Sawada, J.; Cassidy, A.; Alvarez-Icaza, R.; Arthur, J.; Merolla, P.; Imam, N.; Nakamura, Y.; Datta, P.; Nam, G.; Taba, B.; Beakes, M.; Brezzo, B.; Kuang, J.B.; Manohar, R.; Risk, W.P.; Jackson, B.; Modha, D.S.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 34(10):1537-1557 Oct, 2015
Academic Journal
Sandlund, J.; Banaei, N.; Lim, S.; Queralto, N.; Huang, R.; Yun, J.; Taba, B.; Song, R.; Odero, R.; Ouma, G.; Sitati, R.; Murithi, W.; Cain, K.P.
In: Diagnostic Microbiology and Infectious Disease . (Diagnostic Microbiology and Infectious Disease, December 2018, 92(4):299-304)
Academic Journal
Esser, S.K.; Merolla, P.A.; Arthur, J.V.; Cassidy, A.S.; Appuswamy, R.; Andreopoulos, A.; Berg, D.J.; McKinstry, J.L.; Melano, T.; Barch, D.R.; Di Nolfo, C.; Datta, P.; Amir, A.; Taba, B.; Flickner, M.D.; Modha, D.S.
In: Proceedings of the National Academy of Sciences of the United States of America . (Proceedings of the National Academy of Sciences of the United States of America, 11 October 2016, 113(41):11441-11446)
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[AR] Taba, B.
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