학술논문
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Academic Journal
Matsuo, H.; Yamashita, H.; Shimada, Y.; Ishihara, N.; Seto, S.; Morita, S.; Ukishima, M.; Arayashiki, Y.; Kajiwara, S.; Murayama, A.; Nishiyama, K.; Sugimae, K.; Mori, S.; Saito, Y.; Shundo, T.; Kanno, Y.; Uchiyama, Y.; Aisou, F.; Sekine, K.; Ohtani, N.; Kamiya, H.
In: Japanese Journal of Applied Physics . (Japanese Journal of Applied Physics, 1 April 2024, 63(4))
Conference
Ishihara, N.; Shimada, Y.; Ochi, T.; Seto, S.; Matsuo, H.; Yamashita, H.; Morita, S.; Ukishima, M.; Uejima, K.; Arayashiki, Y.; Kajiwara, S.; Murayama, A.; Nishiyama, K.; Sugimae, K.; Mori, S.; Saito, Y.; Shundo, T.; Maeda, A.; Kamiya, H.; Uchiyama, Y.; Fujiwara, M.; Aiso, F.; Sekine, K.; Ohtani, N.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Morooka, T.; Ishikawa, T.; Komura, M.; Kato, T.; Koyama, Y.; Han, Y.; Sugawara, Y.; Kuwabara, D.; Arayashiki, Y.; Murayama, A.; Nishiyama, K.; Sugimae, K.; Ogura, T.; Takeda, H.; Kariya, N.; Goki, Y.; Konuma, S.; Kamiya, Y.; Yamashita, H.; Shiga, H.; Itagaki, K.; Tanaka, R.; Maeda, T.; Ohtani, N.; Fujiwara, M.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :308-309 Jun, 2022
Conference
Kajiyama, T.; Aochi, H.; Asao, Y.; Morikado, M.; Koyama, H.; Sugimae, K.; Ishibashi, S.; Hosotani, K.; Kito, M.; Sato, A.; Kido, M.; Sakuma, M.; Sato, M.; Watanabe, S.; Miyawaki, N.; Hamamoto, T.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :357-360 2000
Conference
Kawanoue, T.; Iijima, T.; Matsuda, T.; Yamada, Y.; Morikado, M.; Sugimae, K.; Kajiyama, T.; Maekawa, H.; Hamamoto, T.; Kumagai, J.; Kaneko, H.; Hayasaka, N.
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :199-201 2000
Conference
Yaegashi, T.; Okamura, T.; Sakamoto, W.; Matsunaga, Y.; Toba, T.; Sakuma, K.; Gomikawa, K.; Komiya, K.; Nagashima, H.; Akahori, H.; Sekine, K.; Kai, T.; Ozawa, Y.; Sugi, M.; Watanabe, S.; Narita, K.; Umemura, M.; Kutsukake, H.; Sakuma, M.; Maekawa, H.; Ishibashi, Y.; Sugimae, K.; Koyama, H.; Izumida, T.; Kondo, M.; Aoki, N.; Watanabe, T.
2009 Symposium on VLSI Technology VLSI Technology, 2009 Symposium on. :190-191 Jun, 2009
Conference
Ichige, M.; Takeuchi, Y.; Sugimae, K.; Sato, A.; Matsui, M.; Kamigaichi, T.; Kutsukake, H.; Ishibashi, Y.; Saito, M.; Mori, S.; Meguro, H.; Miyazaki, S.; Miwa, T.; Takahashi, S.; Iguchi, T.; Kawai, N.; Tamon, S.; Arai, N.; Kamata, H.; Minami, T.; Iizuka, H.; Higashitani, M.; Pham, T.; Hemink, G.; Momodomi, M.; Shirota, R.
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) VLSI technology VLSI Technology, 2003. Digest of Technical Papers. 2003 Symposium on. :89-90 2003
Conference
Kawanoue, T.; Iijima, T.; Matsuda, T.; Yamada, Y.; Morikado, M.; Sugimae, K.; Kajiyama, T.; Maekawa, H.; Hamamoto, T.; Kumagai, J.; Kaneko, H.; Hayasaka, N.
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407); 2000, p199-201, 3p
Conference
Ichige, M.; Takeuchi, Y.; Sugimae, K.; Sato, A.; Matsui, M.; Kamigaichi, T.; Kutsukake, H.; Ishibashi, Y.; Saito, M.; Shirota, R.; Kawai, N.; Tamon, S.; Arai, N.; Kamata, H.; Minami, T.; Momodomi, M.; Meguro, H.; Miyazaki, S.; Miwa, T.; Takahashi, S.; Mori, S.; Iguchi, T.; Iizuka, H.; Higashitani, M.; Pham, T.; Hemink, G.
In: Digest of Technical Papers - Symposium on VLSI Technology . (Digest of Technical Papers - Symposium on VLSI Technology, 2003, :89-90)
Conference
Kajiyama, T.; Aochi, H.; Asao, Y.; Morikado, M.; Koyama, H.; Sugimae, K.; Ishibashi, S.; Hosotani, K.; Kito, M.; Sato, A.; Kido, M.; Sakuma, M.; Sato, M.; Watanabe, S.; Miyawaki, N.; Hamamoto, T.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2000, :357-360)
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[AR] Sugimae, K.
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