학술논문
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Academic Journal
Young, S.R.; Dworak, E.M.; Kaat, A.J.; Adam, H.; Novack, M.A.; Nowinski, C.J.; Hosseinian, Z.; Amagai, S.; Pila, S.; Diaz, M.V.; Correa, A.A.; Gershon, R.M.; Slotkin, J.; Stoeger, J.; Alperin, K.; Omberg, L.; Kellen, M.; Camacho, M.R.; Landavazo, B.; Nosheny, R.L.; Weiner, M.W.
In: Archives of Clinical Neuropsychology . (Archives of Clinical Neuropsychology, 1 September 2024, 39(6):714-723)
Academic Journal
Novack, M.A.; Young, S.R.; Dworak, E.M.; Kaat, A.J.; Nowinski, C.; Yao, L.; Adam, H.; Stoeger, J.; Hosseinian, Z.; Amagai, S.; Pila, S.; Varela Diaz, M.; Almonte Correa, A.; Gershon, R.C.; Slotkin, J.; Alperin, K.; Carlson, S.; Kellen, M.; Omberg, L.; Camacho, M.R.; Landavazo, B.; Nosheny, R.L.; Weiner, M.W.
In: Journal of the International Neuropsychological Society . (Journal of the International Neuropsychological Society, 2024)
Academic Journal
Young, S.R.; Dworak, E.M.; Novack, M.A.; Kaat, A.J.; Adam, H.; Nowinski, C.J.; Hosseinian, Z.; Amagai, S.; Varela Diaz, M.; Almonte Correa, A.; Gershon, R.; Slotkin, J.; Stoeger, J.; Alperin, K.; Omberg, L.; Kellen, M.; Camacho, M.R.; Landavazo, B.; Nosheny, R.L.; Weiner, M.W.
In: Journal of Clinical and Experimental Neuropsychology . (Journal of Clinical and Experimental Neuropsychology, 2024, 46(4):364-373)
Conference
Hafez, W.; Agnihotri, P.; Asoro, M.; Aykol, M.; Bains, B.; Bambery, R.; Bapna, M.; Barik, A.; Chatterjee, A.; Chiu, P.C.; Chu, T.; Firby, C.; Fischer, K.; Fradkin, M.; Greve, H.; Gupta, A.; Haralson, E.; Haran, M.; Hicks, J.; Illa, A.; Jang, M.; Klopcic, S.; Kobrinsky, M.; Kuns, B.; Lai, H.-h.; Lanni, G.; Lee, S.-H.; Lindert, N.; Lo, C.-l.; Luo, Y.; Malyavanatham, G.; Marinkovic, B.; Maymon, Y.; Nabors, M.; Neirynck, J.; Packan, P.; Paliwal, A.; Pantisano, L.; Paulson, L.; Penmatsa, P.; Prasad, C.; Puls, C.; Rahman, T.; Ramaswamy, R.; Samant, S.; Sell, B.; Sethi, K.; Shah, F.; Shamanna, M.; Shang, K.; Li, Q.; Sibakoti, M.; Stoeger, J.; Strutt, N.; Thirugnanasambandam, R.; Tsai, C.; Wang, X.; Wang, A.; Wu, S.-j.; Xu, Q.; Zhong, X.-h.; Natarajan, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Sell, B.; Bigwood, B.; Cha, S.; Chen, Z.; Dhage, P.; Fan, P.; Giraud-Carrier, M.; Kar, A.; Karl, E.; Ku, C.-J.; Kumar, R.; Lajoie, T.; Lee, H.-J.; Liu, G.; Liu, S.; Ma, Y.; Mudanai, S.; Nguyen, L.; Paulson, L.; Phoa, K.; Pierce, K.; Roy, A.; Russell, R.; Sandford, J.; Stoeger, J.; Stojanovic, N.; Sultana, A.; Waldemer, J.; Wan, J.; Xu, W.; Young, D.; Zhang, J.; Zhang, Y.; Bai, P.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.4.1-29.4.4 Dec, 2017
Conference
Sell, B.; Bigwood, B.; Cha, S.; Chen, Z.; Dhage, P.; Fan, P.; Giraud-Carrier, M.; Kar, A.; Karl, E.; Ku, C.-J.; Kumar, R.; Lajoie, T.; Lee, H.-J.; Liu, G.; Liu, S.; Ma, Y.; Mudanai, S.; Nguyen, L.; Paulson, L.; Phoa, K.; Pierce, K.; Roy, A.; Russell, R.; Sandford, J.; Stoeger, J.; Stojanovic, N.; Sultana, A.; Waldemer, J.; Wan, J.; Xu, W.; Zhang, J.; Zhang, Y.; Bai, P.; Young, D.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :29.4.1-29.4.4)
Conference
In: Laser Metrology and Machine Performance VI , Laser Metrology and Machine Performance VI. (Laser Metrology and Machine Performance VI, 2003, :89-96)
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제한된 항목
[AR] Stoeger, J.
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