학술논문
'학술논문'
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Academic Journal
Marsic, N.; Muller, W.F.O.; Tympel, V.; Stohlker, T.; Stapelfeld, M.; Schmidl, F.; Schmelz, M.; Zakosarenko, V.; Stolz, R.; Haider, D.; Sieber, T.; Schwickert, M.; De Gersem, H.
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 32(9):1-9 Dec, 2022
Academic Journal
Stapelfeld, M.; Schmidl, F.; Seidel, P.; Stuck, S.; Tympel, V.; Stohlker, T.; Haider, D.; Schwickert, M.; Sieber, T.; Schmelz, M.; Schonau, T.; Stolz, R.
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 31(5):1-4 Aug, 2021
Conference
Stapelfeld, M.; Schmidl, F.; Seidel, P.; Stuck, S.; Tympel, V.; Stohlker, T.; Haider, D.; Schwickert, M.; Sieber, T.; Schmelz, M.; Schonau, T.; Stolz, R.
2020 IEEE SENSORS SENSORS, 2020 IEEE. :1-4 Oct, 2020
Conference
Haider, D.M.; Reiter, A.; Schwickert, M.; Sieber, T.; Ucar, F.; Stoehlker, T.; De Gersem, H.; Marsic, N.; Mueller, W.F.O.; Schmelz, M.; Stolz, R.; Zakosarenko, V.; Stapelfeld, M.; Tympel, V.
In: Proceedings of the International Beam Instrumentation Conference, IBIC , IBIC 2021 - Proceedings of the 10th International Beam Instrumentation Conference. (Proceedings of the International Beam Instrumentation Conference, IBIC, 2021, :349-352)
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[AR] Stapelfeld, M.
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