학술논문
'학술논문'
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1~10
Academic Journal
In: Metrologia . (Metrologia, 1 June 2023, 60(3))
Academic Journal
Saadeh, Q.; Scholze, F.; Buchholz, C.; Stadelhoff, C.; Wiesner, T.; Soltwisch, V.; Naujok, P.; Wu, M.; Philipsen, V.; Thakare, D.
In: Applied Optics . (Applied Optics, 20 November 2022, 61(33):10032-10042)
Academic Journal
Saadeh, Q.; Honicke, P.; Laubis, C.; Buchholz, C.; Andrle, A.; Stadelhoff, C.; Mentzel, H.; Schonstedt, A.; Soltwisch, V.; Scholze, F.; Naujok, P.; Philipsen, V.
In: Optics Express . (Optics Express, 6 December 2021, 29(25):40993-41013)
Conference
Laubis, C.; Babalik, A.; Babuschkin, A.; Barboutis, A.; Buchholz, C.; Fischer, A.; Jaroslawzew, S.; Lehnert, J.; Mentzel, H.; Puls, J.; Schönstedt, A.; Sintschuk, M.; Stadelhoff, C.; Tagbo, C.; Scholze, F.
Proceedings of SPIE; 1/20/2019, Vol. 10957, p109571L-1-109571L-12, 12p
Periodical
Goldberg, Kenneth A.; Laubis, C.; Babalik, A.; Babuschkin, A.; Barboutis, A.; Buchholz, C.; Fischer, A.; Jaroslawzew, S.; Lehnert, J.; Mentzel, H.; Puls, J.; Schönstedt, A.; Sintschuk, M.; Stadelhoff, C.; Tagbo, C.; Scholze, F.
Proceedings of SPIE; March 2019, Vol. 10957 Issue: 1 p109571L-109571L-12, 10847542p
Academic Journal
In: PTB - Mitteilungen Forschen und Prufen . (PTB - Mitteilungen Forschen und Prufen, 1 December 2014, 124(4):3-7)
Conference
Laubis, C.; Barboutis, A.; Buchholz, C.; Fischer, A.; Haase, A.; Knorr, F.; Mentzel, H.; Puls, J.; Schonstedt, A.; Sintschuk, M.; Soltwisch, V.; Stadelhoff, C.; Scholze, F.
In: Proceedings of SPIE - The International Society for Optical Engineering , Extreme Ultraviolet (EUV) Lithography VII. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9776)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 2015, 9422)
Conference
Laubis, C.; Barboutis, A.; Biel, M.; Buchholz, C.; Dubrau, B.; Fischer, A.; Hesse, A.; Puls, J.; Stadelhoff, C.; Soltwisch, V.; Scholze, F.
In: Proceedings of SPIE - The International Society for Optical Engineering , Extreme Ultraviolet (EUV) Lithography IV. (Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8679)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Extreme Ultraviolet (EUV) Lithography. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7636)
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제한된 항목
[AR] Stadelhoff, C.
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