학술논문
'학술논문'
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Academic Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 43(4):1079-1092 Apr, 2024
Academic Journal
Allegorico, E.; Bosso, G.; Pagano, A.; Porta, G.; Serra, C.; Minerva, V.; Vicario, F.D.; Altruda, C.; Arbo, P.; Russo, T.; Ruffa, G.; Mormile, C.; Numis, F.; Buonerba, C.; Cannavacciuolo, F.; Dolce, P.; Mercurio, V.; Gervasio, G.; Costanzo, G.D.; Ragozzino, A.; Sio, C.D.; Franco, N.; Facchini, G.; Scafuri, L.
In: Future Science OA . (Future Science OA, January 2021, 7(1))
Academic Journal
Gentile, P.; De Angelis, B.; Cervelli, V.; Scioli, M.G.; Bielli, A.; Orlandi, A.; Sio, C.D.; De Fazio, D.; Trivisonno, A.; Ceccarelli, G.; Garcovich, S.
In: Biomedicines . (Biomedicines, 1 June 2019, 7(2))
Conference
In: Proceedings - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume, DSN-S 2023 , Proceedings - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume, DSN-S 2023. (Proceedings - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume, DSN-S 2023, 2023, :217-223)
Academic Journal
Morganti, M.; Bertin, V.; Brunner, J.; Busto, J.; Coyle, P.; Domi, A.; Dornic, D.; Enzenhöfer, A.; Lincetto, M.; Maggi, G.; Perrin-Terrin, M.; Quinn, L.; Salvadori, I.; Zaborov, D.; Akrame, S.E.; Chabab, M.; Loucatos, S.; Pühlhofer, G.; Santangelo, A.; Anton, G.; Biernoth, C.; Eberl, T.; Gal, T.; Geißelsöder, S.; Graf, K.; Hallmann, S.; Heid, T.; Hofestädt, J.; James, C.W.; Kalekin, O.; Katz, U.F.; Kießling, D.; Lahmann, R.; Moser, M.; Reubelt, J.; Stransky, D.; Stüven, T.; Volkert, M.; Wilms, J.; Celli, S.; Durocher, M.; Berg, A.V.D.; Barrios-Martí, J.; Calvo, D.; Coleiro, A.; Molla, M.C.; Gozzini, S.R.; Hernández-Rey, J.J.; Illuminati, G.; Chowdhury, N.R.K.; Lotze, M.; Pérez Romero, J.; Real, D.; Thakore, T.; Zornoza, J.D.; Zuniga, J.; Pellegrino, C.; Biagi, S.; Cherubini, S.; Cocimano, R.; Coniglione, R.; Cuttone, G.; Distefano, C.; Ferrara, G.; Giorgio, E.; Leone, F.; Migneco, E.; Musumeci, M.; Orlando, A.; Papaleo, R.; Piattelli, P.; Poma, G.E.; Pulvirenti, S.; Riccobene, G.; Rovelli, A.; Sapienza, P.; Sciacca, V.; Trovato, A.; Viola, S.; Chiarella, V.; Martini, A.; Circella, M.; Sánchez Losa, A.; Sgura, I.; Chiarusi, T.; Donà, R.; Fusco, L.A.; Levi, G.; Margiotta, A.; Pellegrini, G.; Spurio, M.; Valieri, C.; Versari, F.; Aiello, S.; Leonora, E.; Longhitano, F.; Randazzo, N.; Tatone, F.; Anghinolfi, M.; Briukhanova, N.; Kulikovskiy, V.; Poirè, C.; Sanguineti, M.; Taiuti, M.; Barbarino, G.; Buompane, R.; D'Onofrio, A.; Garufi, F.; Gialanella, L.; Marzaioli, F.; Mele, R.; Migliozzi, P.; Mollo, C.M.; Pisanti, O.; Spisso, B.; Vivolo, D.; Grasso, D.; Marinelli, A.; Raffaelli, F.; Ameli, F.; Biagioni, A.; Capone, A.; Palma, I.D.; Lonardo, A.; Nicolau, C.A.; Simeone, F.; Branzaş, H.; Caramete, L.; Pǎvǎlaş, G.E.; Popa, V.; Bormuth, R.; Samtleben, D.F.E.; Boumaaza, J.; Tayalati, Y.; Anassontzis, E.G.; Resvanis, L.; Kalaczyński, P.; Mańczak, J.; Mijakowski, P.; Androulakis, G.; Bagatelas, C.; Belias, A.; Markou, C.; Panagopoulos, V.; Pikounis, K.; Polydefki, G.; Sinopoulou, A.; Stavropoulos, D.; Tsagkli, S.; Tzamariudaki, E.; Tzanetatos, D.; Baars, M.; Berbee, E.; Bouwhuis, M.; Eijk, D.V.; Heijboer, A.; Jongen, M.; De Jong, M.; De Jong, P.; Kieft, G.; Koffeman, E.N.; Melis, K.W.; Nauta, L.; Steijger, J.; Strandberg, B.; Timmer, P.; De Wolf, E.; Haren, H.V.; Dallier, R.; Martin, L.; Papalashvili, G.; Shanidze, R.; Buis, E.; Muller, R.; Navas, S.; Tenllado, E.; Díaz, A.F.; Giuliante, A.; Sharma, A.; Bozza, C.; Sio, C.D.; Grella, G.; Stellacci, S.M.; Andre, M.; Ardid, M.; Martínez-Mora, J.A.; Ruiz, R.G.; Organokov, M.; Pradier, T.; Richer, M.; Aublin, J.; Avgitas, T.; Baret, B.; Bourret, S.; Coelho, J.A.B.; Creusot, A.; Donzaud, C.; Gauchery, S.; Grégoire, T.; Kouchner, A.; Breton, R.L.; Nielsen, C.; Vallage, B.; Elewyck, V.V.; Bojaddaini, I.E.; Moussa, A.; Bruijn, R.; Jongewaard, B.; Kooijman, P.; Post, M.; Schermer, B.; Seneca, J.; De Waardt, L.; Miranda, L.S.; Razzaque, S.; Dörr, M.; Elsaesser, D.; Hekalo, A.; Kadler, M.; Kreter, M.; Mannheim, K.
In: Journal of Instrumentation . (Journal of Instrumentation, 31 May 2018, 13(5))
Conference
In: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT , Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2022, 2022-October)
Conference
In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC , Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, 2021, 2021-October)
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[AR] Sio, C.D.
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