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'학술논문'
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Semicircular Dielectric Gratings for Strongly Polarized and Enhanced Emission from InAs Quantum Dots
Conference
DeCrescent, Ryan A; Wang, Zixuan; Imany, Poolad; Boutelle, Robert C; Mirin, Richard P; Silverman, Kevin L
2022 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2022 Conference on. :1-2 May, 2022
Academic Journal
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
DeCrescent RA; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Wang Z; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA.; Imany P; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, CO 80309, USA.; Nam SW; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Mirin RP; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Silverman KL; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Publisher: American Physical Society Country of Publication: United States NLM ID: 101633995 Publication Model: Print Cited Medium: Print ISSN: 2331-7019 (Print) Linking ISSN: 23317019 NLM ISO Abbreviation: Phys Rev Appl Subsets: PubMed not MEDLINE
Academic Journal
Sun L; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.; Kumar P; Department of Physics, University of California Merced, Merced, California 95340, United States.; Stem Cell Instrumentation Foundry, University of California Merced, Merced, California 95343, United States.; Liu Z; Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States.; Choi J; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.; Fang B; The Center for Dynamics and Control of Materials: An NSF MRSEC, The University of Texas at Austin, Austin, Texas 78712, United States.; Roesch S; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.; Department of Physics, University of Tübingen, Tübingen D72076, Germany.; Tran K; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.; Casara J; Department of Physics, University of California Merced, Merced, California 95340, United States.; Priego E; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.; Chang YM; Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan.; Moody G; Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, California 93106, United States.; Silverman KL; National Institute of Standards and Technology, Boulder, Colorado 80305, United States.; Lorenz VO; Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States.; IQUIST, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States.; Scheibner M; Department of Physics, University of California Merced, Merced, California 95340, United States.; Luo T; Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States.; Li X; Department of Physics, The University of Texas at Austin, Austin, Texas 78712, United States.
Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
Buckley SM; Tait AN; Moody G; Primavera B; Olson S; Herman J; Silverman KL; Papa Rao S; Woo Nam S; Mirin RP; Shainline JM
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE; MEDLINE
Academic Journal
Tran K; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Moody G; National Institute of Standards & Technology, Boulder, CO, USA.; Wu F; Materials Science Division, Argonne National Laboratory, Argonne, IL, USA. wufcheng@gmail.com.; Lu X; Department of Physics, Washington University in St Louis, St Louis, MO, USA.; Choi J; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Kim K; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA.; Rai A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA.; Sanchez DA; Texas Materials Institute, The University of Texas at Austin, Austin, TX, USA.; Quan J; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Singh A; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Department of Material Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.; Embley J; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Zepeda A; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Campbell M; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Autry T; National Institute of Standards & Technology, Boulder, CO, USA.; Taniguchi T; National Institute of Material Science, Tsukuba, Japan.; Watanabe K; National Institute of Material Science, Tsukuba, Japan.; Lu N; Texas Materials Institute, The University of Texas at Austin, Austin, TX, USA.; Department of Aerospace Engineering and Engineering Mechanics, The University of Texas at Austin, Austin, TX, USA.; Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA.; Silverman KL; National Institute of Standards & Technology, Boulder, CO, USA.; Kim S; Department of Photonics and Nanoelectronics and Department of Applied Physics, Hanyang University, Ansan, South Korea.; Tutuc E; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, USA.; Yang L; Department of Physics, Washington University in St Louis, St Louis, MO, USA.; MacDonald AH; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA.; Li X; Department of Physics and Center for Complex Quantum Systems, The University of Texas at Austin, Austin, TX, USA. elaineli@physics.utexas.edu.; Texas Materials Institute, The University of Texas at Austin, Austin, TX, USA. elaineli@physics.utexas.edu.
Publisher: Nature Publishing Group Country of Publication: England NLM ID: 0410462 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4687 (Electronic) Linking ISSN: 00280836 NLM ISO Abbreviation: Nature Subsets: PubMed not MEDLINE
Academic Journal
Moody G; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Tran K; Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, USA.; Lu X; Department of Physics and Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, Missouri 63136, USA.; Autry T; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Fraser JM; Department of Physics, Engineering Physics and Astronomy, Queen's University, Kingston, Ontario K7L 3N6, Canada.; Mirin RP; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Yang L; Department of Physics and Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, Missouri 63136, USA.; Li X; Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, USA.; Silverman KL; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print Cited Medium: Internet ISSN: 1079-7114 (Electronic) Linking ISSN: 00319007 NLM ISO Abbreviation: Phys Rev Lett Subsets: PubMed not MEDLINE
Academic Journal
O'Neil GC; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Miaja-Avila L; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Joe YI; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Alpert BK; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Balasubramanian M; Advanced Photon Source, Argonne National Laboratory , Lemont, Illinois 60439, United States.; Sagar DM; JILA, National Institute of Standards and Technology and University of Colorado Boulder , Boulder, Colorado 80309, United States.; Doriese W; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Fowler JW; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Fullagar WK; Department of Chemical Physics, Lund University , Lund 223 62, Sweden.; Chen N; Canadian Light Source , Saskatoon, Saskatchewan S7N 2V3, Canada.; Hilton GC; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Jimenez R; JILA, National Institute of Standards and Technology and University of Colorado Boulder , Boulder, Colorado 80309, United States.; Department of Chemistry and Biochemistry, University of Colorado Boulder , Boulder, Colorado 80309, United States.; Ravel B; National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.; Reintsema CD; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Schmidt DR; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Silverman KL; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Swetz DS; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Uhlig J; Department of Chemical Physics, Lund University , Lund 223 62, Sweden.; Ullom JN; National Institute of Standards and Technology , Boulder, Colorado 80305, United States.; Department of Physics, University of Colorado Boulder , Boulder, Colorado 80309, United States.
Publisher: American Chemical Society Country of Publication: United States NLM ID: 101526034 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1948-7185 (Electronic) Linking ISSN: 19487185 NLM ISO Abbreviation: J Phys Chem Lett Subsets: PubMed not MEDLINE
All-silicon light-emitting diodes waveguide-integrated with superconducting single-photon detectors.
Academic Journal
Buckley S; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Chiles J; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; McCaughan AN; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Moody G; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Silverman KL; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Stevens MJ; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Mirin RP; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Nam SW; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.; Shainline JM; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Publisher: American Institute of Physics Country of Publication: United States NLM ID: 9881183 Publication Model: Print Cited Medium: Print ISSN: 0003-6951 (Print) Linking ISSN: 00036951 NLM ISO Abbreviation: Appl Phys Lett Subsets: PubMed not MEDLINE
Academic Journal
Moody G; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; McDonald C; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Feldman A; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Harvey T; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Mirin RP; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.; Silverman KL; National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101643595 Publication Model: Print-Electronic Cited Medium: Print ISSN: 2334-2536 (Print) Linking ISSN: 23342536 NLM ISO Abbreviation: Optica Subsets: PubMed not MEDLINE
Academic Journal
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: PubMed not MEDLINE
Academic Journal
Feng M; JILA, University of Colorado and National Institute of Standards and Technology, Boulder, CO 80309-0440, USA.; Silverman KL; Mirin RP; Cundiff ST
Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 101137103 Publication Model: Print Cited Medium: Internet ISSN: 1094-4087 (Electronic) Linking ISSN: 10944087 NLM ISO Abbreviation: Opt Express Subsets: MEDLINE
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[AR] Silverman, Kevin L
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