학술논문
'학술논문'
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Academic Journal
Eitan, C.; Siany, A.; Olender, T.; Danino, Y.M.; Yanowski, E.; Marmor-Kollet, H.; Rivkin, N.; Yacovzada, N.S.; Elbaz-Alon, Y.; Cohen, Y.; Chapnik, E.; Hornstein, E.; Hornstein, E.; Barkan, E.; Rothschild, D.; Weissbrod, O.; Segal, E.; van Eijk, K.R.; Kenna, K.P.; van der Spek, R.A.A.; van den Berg, L.H.; Veldink, J.H.; Kenna, K.P.; van den Berg, L.H.; Moisse, M.; Van Damme, P.; Farhan, S.M.K.; Hung, S.-T.; Ichida, J.K.; Cooper-Knock, J.; Shaw, P.J.; Yu, C.-H.; Louis, C.; Masters, S.L.; Sproviero, W.; Al Khleifat, A.; Iacoangeli, A.; Shatunov, A.; Jones, A.R.; Al-Chalabi, A.; Beck, G.; Ainbinder, E.; Ben-Dor, S.; Werneburg, S.; Schafer, D.P.; Brown, R.H.; Phatnani, H.
In: Nature Neuroscience . (Nature Neuroscience, 01 April 2022, 25(4):433-445)
Academic Journal
Marmor-Kollet, H.; Siany, A.; Rivkin, N.; Danino, Y.M.; Olender, T.; Sheban, D.; Cohen, N.; Ravid, R.; Eitan, C.; Toth Cohen, B.; Hanna, J.H.; Hornstein, E.; Kedersha, N.; Hofmann, S.; Riggs, C.L.; Advani, V.M.; Anderson, P.; Ivanov, P.; Geiger, T.; Knafo, N.; Moens, T.G.; Van Den Bosch, L.; Merbl, Y.; Dadosh, T.; Addadi, Y.; Higginbottom, A.; Cooper-Knock, J.
In: Molecular Cell . (Molecular Cell, 3 December 2020, 80(5):876-891.e6)
Academic Journal
Reichenstein, I.; Eitan, C.; Haim, G.; Magen, I.; Siany, A.; Rivkin, N.; Olender, T.; Toth, B.; Ravid, R.; Mandelbaum, A.D.; Yanowski, E.; Liang, J.; Hornstein, E.; van Eijk, K.R.; Al-Chalabi, A.; Başak, A.N.; van den Berg, L.H.; Hardiman, O.; Landers, J.E.; Mora, J.S.; Morrison, K.E.; Shaw, P.J.; Veldink, J.H.; Diaz-Garcia, S.; Ravits, J.M.; Hoye, M.L.; Miller, T.M.; Rymer, J.K.; Gross, C.; Levy, R.; Yizhar, O.; Beck, G.; Ainbinder, E.; Farhan, S.M.K.; Lennox, K.A.; Bode, N.M.; Behlke, M.A.; Möller, T.; Saxena, S.; Moreno, C.A.M.; Harms, M.B.; Costaguta, G.; Pfaff, S.L.; Phatnani, H.; Brown, R.H.
In: Science Translational Medicine . (Science Translational Medicine, 18 December 2019, 11(523))
Conference
Zhang, X.; Karakoy, M.; Wu, K.; Chen, Z.; Ge, Z.; Krishnan, N.; Siany, A.; Levi, S.; Schwarzband, I.; Kris, R.
In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018 , 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018. (2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2018, 5 June 2018, :320-323)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2012, 8324)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7638)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Design for Manufacturability through Design-Process Integration III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7275)
Conference
Shauly, E.; Drori, R.; Cohen-Yasour, M.; Rotstein, I.; Menadeva, O.; Peltinov, R.; Bartov, A.; Latinski, S.; Siany, A.; Geshesl, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
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제한된 항목
[AR] Siany, A.
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