학술논문
'학술논문'
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Academic Journal
Li, Jian-De; Kuo, Chun-Hao; Lu, Guan-Ruei; Wang, Sying-Jyan; Shu-Min Li, Katherine; Ho, Tsung-Yi; Chen, Hung-Ming; Hu, Shiyan
In Microelectronics Journal January 2019 83:185-196
Conference
Chen, Leon Li-Yang; Shu-Min Li, Katherine; Jiang, Xu-Hao; Wang, Sying-Jyan; Huang, Andrew Yi-Ann; Chen, Jwu E; Liang, Hsing-Chung; Hsu, Chun-Lung
2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :208-212 Oct, 2021
Conference
Liao, Peter Yi-Yu; Shu-Min Li, Katherine; Chen, Leon Li-Yang; Wang, Sying-Jyan; Huang, Andrew Yi-Ann; Chau-Cheung Cheng, Ken; Tsai, Nova Cheng-Yen; Chou, Leon
2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :309-313 Oct, 2021
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis
Conference
Cheng, Ken Chau-Cheung; Shu-Min Li, Katherine; Huang, Andrew Yi-Ann; Li, Ji-Wei; Chen, Leon Li-Yang; Cheng-Yen Tsai, Nova; Wang, Sying-Jyan; Lee, Chen-Shiun; Chou, Leon; Liao, Peter Yi-Yu; Liang, Hsing-Chung; Chen, Jwu-E
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :1710-1711 Mar, 2020
Conference
Hu, Dyi-Chung; Hashimoto, Hirohito; Tseng, Li-Fong; Cheng, Ken Chau-Cheung; Shu-Min Li, Katherine; Wang, Sying-Jyan; Chen, Sean Y.-S.; Chen, Jwu E; Liu, Clark; Huang, Andrew
2020 IEEE 38th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2020 IEEE 38th. :1-1 Apr, 2020
Academic Journal
IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 28(2):62-69 Apr, 2011
Conference
2009 Asia and South Pacific Design Automation Conference Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific. :49-54 Jan, 2009
Conference
DAC: Annual ACM/IEEE Design Automation Conference; 2019, Issue 56, p145-150, 6p
Academic Journal
Academic Journal
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[AR] Shu-Min Li, Katherine
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