학술논문
'학술논문'
에서 검색결과 10건 | 목록
1~10
Conference
Garcia, Paulo R.; Grandesi, Guilherme I; Boas, Alexis V.; Giacomini, Renato; Santos, R. B. B.; Seixas, L. E.; Guazzelli, Marcilei A.
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2023 37th Symposium on. :1-4 Aug, 2023
Conference
Boas, Alexis C. Vilas; de Melo, M. A. A.; Santos, R. B. B.; Giacomini, R.; Medina, N. H.; Seixas, L. E.; Finco, S.; Palomo, F. R; Romero-Maestro, A.; Guazzelli, Marcilei A.
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :1-4 Sep, 2019
Conference
Boas, Alexis C. Vilas; de Melo, M. A. A.; Santos, R. B. B.; Giacomini, R. C.; Medina, N. H.; Seixas, L. E.; Palomo, F. R; Guazzelli, Marcilei A.
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2019 34th Symposium on. :1-4 Aug, 2019
Conference
Medina, N. H.; Silveira, M. A. G.; Added, N.; Aguiar, V. A. P.; Aguirre, F.; Giacomini, R.; Macchione, E. L. A.; de Melo, M. A. A.; Oliveira, J. A.; Santos, R. B. B.; Seixas, L. E.; Tabacniks, M. H.
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-7 Sep, 2013
Conference
Medina, N. H.; Silveira, M. A. G.; Added, N.; Aguiar, V. A. P.; Giacomini, R.; Macchione, E. L. A.; de Melo, M. A. A.; Santos, R. B. B.; Seixas, L. E.
2014 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2014 IEEE. :1-3 Jul, 2014
Academic Journal
Journal of Integrated Circuits & Systems; 2020, Vol. 15 Issue 3, p1-5, 5p
Academic Journal
Vilas Boas, Alexis C.; de Melo, M. A. A.; Santos, R. B. B.; Giacomini, R.; Medina, N. H.; Seixas, L. E.; Finco, S.; Palomo, F. R.; Romero-Maestre, A.; Guazzelli, Marcilei A.
Academic Journal
IEEE Transactions on Device & Materials Reliability; Sep2017, Vol. 17 Issue 3, p593-595, 3p
Academic Journal
Journal of Electronic Testing: Theory and Applications. April 2017 33(2):267-274
Academic Journal
Silveira, M. A. G.; Cirne, K. H.; Santos, R. B. B.; Gimenez, S. P.; Medina, N. H.; Added, N.; Tabacniks, M. H.; Barbosa, M. D. L.; Seixas, L. E.; Melo, W.; de Lima, J. A.
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제한된 항목
[AR] Seixas, L. E.
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