학술논문
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O'Dell, S.; Elsner, R. F; Kolodziejczak, J. J; Ramsey, B. D; Weisskopf, M. C; Zhang, W. W; Content, D. A; Petre, R; Saha, T. T; Reid, P. B; Schwartz, D. A; Brissenden, R. J; Elvis, M; Freeman, M; Gaetz, T; Gorenstein, P; Jerius, D; Juda, M; Murray, S. S; Podgorski, W. A; Wolk, S. J; Trolier-McKinstry, S
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Jerius, D; Zhao, P; VanSpeybroeck, L; Tennant, A; Swartz, D; Schwartz, D. A; Podgorski, W. A; Harris, B; Graessle, D. E; Gaetz, T. J; Freeman, M. D; Elsner, R; Edgar, R. J; Cohen, L. M
Bulletin of the American Astronomical Society. 29
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Remillard, R. A; Bradt, H. V; Brissenden, R. J. V; Buckley, D. A. H; Schwartz, D. A; Silber, A; Stroozas, B. A; Tuohy, I. R
The Astrophysical Journal. 428(2 pt)
Report
Remillard, R. A; Bradt, H. V. D; Brissenden, R. J. V; Buckley, D. A. H; Roberts, W; Schwartz, D. A; Stroozas, B. A; Tuohy, I. R
Astronomical Journal. 105(6)
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Graessle, D. E; Burbine, T. H; Cobuzzi, J. C; Kellogg, E. M; Schwartz, D. A; Blake, Richard L; Gong, P. P
In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74).
Report
In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74).
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[AR] Schwartz, D. A
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