학술논문
'학술논문'
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Academic Journal
Schaeffer, J.K.; Gilmer, D.C.; Capasso, C.; Kalpat, S.; Taylor, B.; Raymond, M.V.; Triyoso, D.; Hegde, R.; Samavedam, S.B.; White, B.E., Jr
In Microelectronic Engineering 2007 84(9):2196-2200
Conference
Proceedings of 2013 International Conference on IC Design & Technology (ICICDT) IC Design & Technology (ICICDT), 2013 International Conference on. :69-72 May, 2013
Conference
2012 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2012 IEEE International Conference on. :1-4 May, 2012
Conference
Hegde, R.I.; Triyoso, D.H.; Tobin, P.J.; Kalpat, S.; Ramon, M.E.; Tseng, H.-H.; Schaeffer, J.K.; Luckowski, E.; Taylor, W.J.; Capasso, C.C.; Gilmer, D.C.; Moosa, M.; Haggag, A.; Raymond, M.; Roan, D.; Nguyen, J.; La, L.B.; Hebert, E.; Cotton, R.; Wang, X.-D.; Zollner, S.; Gregory, R.; Werho, D.; Rai, R.S.; Fonseca, L.; Stoker, M.; Tracy, C.; Chan, B.W.; Chiu, Y.H.; White, B.E., Jr.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :35-38 2005
Conference
Tseng, H.-H.; Tobin, P.J.; Hebert, E.A.; Kalpat, S.; Ramon, M.E.; Fonseca, L.; Jiang, Z.X.; Schaeffer, J.K.; Hegde, R.I.; Triyoso, D.H.; Gilmer, D.C.; Taylor, W.J.; Capasso, C.C.; Adetutu, O.; Sing, D.; Conner, J.; Luckowski, E.; Chan, B.W.; Haggag, A.; Backer, S.; Noble, R.; Jahanbani, M.; Chiu, Y.H.; White, B.E.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :696-699 2005
Conference
Schaeffer, J.K.; Capasso, C.; Fonseca, L.R.C.; Samavedam, S.; Gilmer, D.C.; Liang, Y.; Kalpat, S.; Adetutu, B.; Tseng, H.-H.; Shiho, Y.; Demkov, A.; Hegde, R.; Taylor, W.J.; Gregory, R.; Jiang, J.; Luckowski, E.; Raymond, M.V.; Moore, K.; Triyoso, D.; Roan, D.; White Jr, B.E.; Tobin, P.J.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :287-290 2004
Conference
Tseng, H.-H.; Capasso, C.C.; Schaeffer, J.K.; Hebert, E.A.; Tobin, P.J.; Gilmer, D.C.; Triyoso, D.; Ramon, M.E.; Kalpat, S.; Luckowski, E.; Taylor, W.J.; Jeon, Y.; Adetutu, O.; Hegde, R.I.; Noble, R.; Jahanbani, M.; El Chemali, C.; White, B.E.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :821-824 2004
Conference
2009 IEEE International Conference on IC Design and Technology IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on. :89-92 May, 2009
Conference
Gilmer, D.C.; Schaeffer, J.K.; Taylor, W.J.; Spencer, G.; Triyoso, D.H.; Raymond, M.; Roan, D.; Smith, J.; Capasso, C.; Hegde, R.I.; Samavedam, S.B.
2006 European Solid-State Device Research Conference Solid-State Device Research Conference, 2006. ESSDERC 2006. Proceeding of the 36th European. :351-354 Sep, 2006
Conference
In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019 , 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019. (2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2019, 14 October 2019)
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[AR] Schaeffer, J.K.
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