학술논문
'학술논문'
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Academic Journal
Cañas, J.; Bellet-Amalric, E.; Harikumar, A.; Monroy, E.; Rochat, N.; Grenier, A.; Jannaud, A.; Saghi, Z.; Rouviere, J.-L.; Bougerol, C.; Rigutti, L.
In: ACS Nano . (ACS Nano, 7 May 2024, 18(18):11886-11897)
Academic Journal
Amichi, L.; Yu, H.; Zachman, M.J.; Cullen, D.A.; Ziabari, A.; Arregui-Mena, D.; Guetaz, L.; David, T.; Ghorbel, A.; Saghi, Z.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . (Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22 July 2023, 29(1):1742-1743)
Conference
Fenouillet-Beranger, C.; Beaurepaire, S.; Deprat, F.; de Sousa, A. Ayres; Brunet, L.; Batude, P.; Rozeau, O.; Andrieu, F.; Besombes, P.; Samson, M-P.; Previtali, B.; Nemouchi, F.; Rodriguez, G.; Rodriguez, P.; Famulok, R.; Rambal, N.; Balan, V.; Saghi, Z.; Jousseaume, V.; Guerin, C.; Ibars, F.; Proud, F.; Nouguier, D.; Ney, D.; Delaye, V.; Dansas, H.; Federspiel, X.; Vinet, M.
2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :252-255 Sep, 2017
Academic Journal
Ferrando-Villalba, P.; D’Ortenzi, L.; Dalkiranis, G. G.; Cara, E.; Lopeandia, A. F.; Abad, Ll.; Rurali, R.; Cartoixà, X.; De Leo, N.; Saghi, Z.; Jacob, M.; Gambacorti, N.; Boarino, L.; Rodríguez-Viejo, J.
Conference
Micout, J.; Sklenard, B.; Batude, P.; Berthelon, R.; Rafhay, Q.; Lacord, J.; Mathieu, B.; Pasini, L.; Saghi, Z.; Delaye, V.; Brunet, L.; Fenouillet-Beranger, C.; Joblot, S.; Mazen, F.; Mazzocchi, V.; Colinge, J-P.; Ghibaudo, G.; Vinet, M.
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-2 Oct, 2017
Academic Journal
Jacob, M.; Lin, J.-M.; Navarro, G.; Jannaud, A.; Saghi, Z.; Gueddari, L.E.; Ciuciu, P.; Mula, G.; Bayle-Guillemaud, P.
In: Ultramicroscopy . (Ultramicroscopy, June 2021, 225)
Academic Journal
In: Semiconductor Science and Technology . (Semiconductor Science and Technology, March 2021, 36(3))
Conference
Pasini, L.; Batude, P.; Lacord, J.; Casse, M.; Mathieu, B.; Sklenard, B.; Luce, F. Piegas; Micout, J.; Payet, A.; Mazen, F.; Besson, P.; Ghegin, E.; Borrel, J.; Daubriac, R.; Hutin, L.; Blachier, D.; Barge, D.; Chhun, S.; Mazzocchi, V.; Cros, A.; Barnes, J-P.; Saghi, Z.; Delaye, V.; Rambal, N.; Lapras, V.; Mazurier, J.; Weber, O.; Andrieu, F.; Brunet, L.; Fenouillet-Beranger, C.; Rafhay, Q.; Ghibaudo, G.; Cristiano, F.; Haond, M.; Boeuf, F.; Vinet, M.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Micout, J.; Lapras, V.; Batude, P.; Fenouillet-Beranger, C.; Lacord, J.; Sklenard, B.; Mathieu, B.; Rafhay, Q.; Mazzocchi, V.; Colinge, J.-P.; Lachal, L.; Garros, X.; Casse, M.; Toffoli, A.; Romano, G.; Allain, F.; Brunet, L.; Hartmann, J.-M.; Bortolin, R.; Mazen, F.; Barraud, S.; Rambal, N.; Tabone, C.; Samson, M.-P.; Besombes, P.; Delaye, V.; Saghi, Z.; Loup, V.; Comboroure, C.; Balan, V.; Desvoivres, L.; Vizioz, C.; Ghibaudo, G.; Vinet, M.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :32.2.1-32.2.4 Dec, 2017
Academic Journal
In: Journal of Physics Communications . (Journal of Physics Communications, 2021, 5(1):1-9)
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[AR] Saghi, Z.
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