학술논문
'학술논문'
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Academic Journal
In: Law and History Review . (Law and History Review, 11 August 2023, 41(3):501-521)
Academic Journal
Todri-Sanial, A.; Ramos, R.; Okuno, H.; Dijon, J.; Dhavamani, A.; Widlicenus, M.; Lilienthal, K.; Uhlig, B.; Sadi, T.; Georgiev, V.; Asenov, A.; Amoroso, S.; Pender, A.; Brown, A.; Millar, C.; Motzfeld, F.; Gotsmann, B.; Liang, J.; Goncalves, G.; Rupesinghe, N.; Teo, K.
IEEE Circuits and Systems Magazine IEEE Circuits Syst. Mag. Circuits and Systems Magazine, IEEE. 17(2):47-62 Jan, 2017
Conference
25th International Vacuum Nanoelectronics Conference Vacuum Nanoelectronics Conference (IVNC), 2012 25th International. :1-2 Jul, 2012
Conference
Dokania, A. K.; Duerr, M.; Lewalter, A.; Merikhi, J.; Berhanu, S.; Bachmann, P.K.; Zexiang Chen; Wirth, T.; Rupesinghe, N.; Teo, K.; Groning, O.
2010 8th International Vacuum Electron Sources Conference and Nanocarbon Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International. :111-112 Oct, 2010
Academic Journal
In: Comparative Legal History . (Comparative Legal History, 2 January 2019, 7(1):37-66)
Conference
Amaratunga, G.A.J.; Milne, W.I.; Teo, K.; Rupesinghe, N.; Jae Eun Jang; Seung Nam Cha; Legagneux, P.; Pirio, G.; Gangloff, L.; Minoux, E.; Wyczisk, F.; Pribat, D.; Iun Tek Han; Jong Ming Kim
The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. LEOS annual meeting Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE. 1:252-253 Vol.1 2004
Academic Journal
Bondino, F.; Magnano, E.; Ciancio, R.; Castellarin Cudia, C.; Carlino, E.; Cepek, C.; Barla, A.; Yakhou-Harris, F.; Rupesinghe, N.
In: Physical Chemistry Chemical Physics . (Physical Chemistry Chemical Physics, 2017, 19(47):32079-32085)
Academic Journal
In: Portuguese Journal of Social Science . (Portuguese Journal of Social Science, 2017, 16(2):143-161)
Academic Journal
Ferrari, A.C.; Bonaccorso, F.; Barbone, M.; Sun, Z.; Pellegrini, V.; Fal'ko, V.; Novoselov, K.S.; Grigorenko, A.N.; Roche, S.; Bøggild, P.; Borini, S.; Kivioja, J.; Ryhänen, T.; Koppens, F.H.L.; Bachtold, A.; Konstantatos, G.; Palermo, V.; Treossi, E.; Pugno, N.; Garrido, J.A.; Sordan, R.; Bianco, A.; Ballerini, L.; Prato, M.; Lidorikis, E.; Marinelli, C.; Morpurgo, A.; Coleman, J.N.; Nicolosi, V.; Colombo, L.; Fert, A.; Garcia-Hernandez, M.; Guinea, F.; Schneider, G.F.; Dekker, C.; Vandersypen, L.; Van Der Zant, H.; Galiotis, C.; Kis, A.; Katsnelson, M.; Loiseau, A.; Morandi, V.; Neumaier, D.; Polini, M.; Tredicucci, A.; Williams, G.M.; Hee Hong, B.; Ahn, J.-H.; Min Kim, J.; Zirath, H.; Löfwander, T.; Van Wees, B.J.; Occhipinti, L.; Di Matteo, A.; Kinloch, I.A.; Seyller, T.; Quesnel, E.; Feng, X.; Teo, K.; Rupesinghe, N.; Hakonen, P.; Neil, S.R.T.; Tannock, Q.; Kinaret, J.
In: Nanoscale . (Nanoscale, 21 March 2015, 7(11):4598-4810)
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[AR] Rupesinghe, N.
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