학술논문

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발행년	- (예 : 2010-2015)

Root cause investigation of back-irradiance-induced failure of high power diode lasers

Conference

Leisher, Paul O.; Pope, David; Platz, Larry; Boisselle, Matthew; Runkel, Mike; Deri, Robert J.; Smith, Steve; Helmrich, Jason D.; Crawford, Devin E.; Thiagarajan, Prabhu; Li, Chen; Pipe, Kevin P.

2017 IEEE High Power Diode Lasers and Systems Conference (HPD) High Power Diode Lasers and Systems Conference (HPD), 2017 IEEE. :53-54 Oct, 2017

Full Text (IEEE) Find it@PNU

A system for measuring defect induced beam modulation on inertial confinement fusion-class laser optics.

Conference

Runkel, Mike; Hawley-Fedder, Ruth; Widmayer, Clay; Williams, Wade; Weinzapfel, Carolyn; Roberts, Dave

Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59912H-59912H-9, 9p

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Laser damage testing of small optics for the National Ignition Facility

Academic Journal

Chow, Robert; Runkel, Mike; Taylor, John R.

Applied Optics. June 10, 2005, Vol. 44 Issue 17, p3527, 5 p.

Full Text (OSA) Web of Science JCR 저널정보 Scopus Find it@PNU

Automated damage onset analysis techniques applied to KDP damage and the Zeus small area damage test facility

Conference

Sharp III, Richard; Runkel, Mike

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 2000, 3902:361-368)

Scopus Find it@PNU

Modeling KDP bulk damage curves for prediction of large-area damage performance

Conference

Runkel, Mike; Sharp III, Richard

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 2000, 3902:436-448)

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Automated damage test facilities for materials development and production optic quality assurance at Lawrence Livermore National Laboratory

Conference

Sheehan, Lynn; Schwartz, Sheldon; Battersby, Colin; Dickson, Richard; Jennings, Richard; Kimmons, Jim; Kozlowski, Mark; Maricle, Stephen; Mouser, Ron; Runkel, Mike; Weinzapfel, Carolyn

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 1999, 3578:302-313)

Scopus Find it@PNU

Monte Carlo simulation of the R/1 automated damage test

Conference

Runkel, Mike

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 1999, 3578:277-289)

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Large-area damage testing of optics

Conference

Sheehan, Lynn M.; Kozlowski, Mark R.; Stolz, Christopher J.; Genin, Francois Y.; Runkel, Mike; Schwartz, Sheldon; Hue, Jean

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 1996, 2775:357-369)

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Optical scatter as a diagnostic tool for studying bulk defects which cause laser damage in conventional and rapid-growth KDP and DKDP

Conference

Woods, Bruce W.; Runkel, Mike; Yan, Ming; De Yoreo, James J.; Kozlowski, Mark R.

In: Proceedings of SPIE - The International Society for Optical Engineering. (Proceedings of SPIE - The International Society for Optical Engineering, 1995, 2541:123-130)

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