학술논문
'학술논문'
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1~10
Periodical
Lépine, Thierry; Babington, James; Gross, Herbert; Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Verlinski, S.; Thienpont, H.; Van Erps, J.
Proceedings of SPIE; June 2024, Vol. 13019 Issue: 1 p130191O-130191O-3, 1171723p
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, June 2023, 145)
Academic Journal
Schifano, L.; Vervaeke, M.; Rosseel, D.; Verbaenen, J.; Thienpont, H.; Berghmans, F.; Smeesters, L.; Dewitte, S.
In: Sensors . (Sensors, November 2022, 22(21))
Conference
Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Verlinski, S.; Thienpont, H.; Van Erps, J.
In: Proceedings of SPIE - The International Society for Optical Engineering , Illumination Optics VII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 13022)
Conference
Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Verlinski, S.; Thienpont, H.; Van Erps, J.
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Design and Engineering IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 13019)
Academic Journal
Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Thienpont, H.; Geernaert, T.; van Erps, J.
In: Optics Express . (Optics Express, 8 November 2021, 29(23):38001-38013)
Periodical
Winston, Roland; Koshel, R. John; Jiang, Lun; Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Thienpont, H.; Geernaert, T.; Van Erps, J.
Proceedings of SPIE; October 2022, Vol. 12220 Issue: 1 p122200C-122200C-4, 1099805p
Periodical
Kidger, Tina E.; David, Stuart; Schupp, Thorsten; Sorgato, S.; Smeesters, L.; Vervaeke, M.; Rochlitz, K.; Rosseel, D.; Verbaenen, J.; Verlinski, S.; Thienpont, H.; Van Erps, J.
Proceedings of SPIE; June 2024, Vol. 13022 Issue: 1 p1302205-1302205-5
Conference
Sorgato, S.; Vervaeke, M.; Van Erps, J.; Smeesters, L.; Rosseel, D.; Rochlitz, K.; Verbaenen, J.; Verlinski, S.; Shcheglov, A.; Thienpont, H.
In: Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress , Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress. (Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress, 2023)
Conference
In: Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress , Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress. (Optical Fabrication and Testing in Proceedings Optica Design and Fabrication Congress 2023, IODC, OFT - Part of Optica Design and Fabrication Congress, 2023)
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[AR] Rosseel, D.
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