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Academic Journal
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-11 2021
Conference
2018 IEEE International Frequency Control Symposium (IFCS) Frequency Control Symposium (IFCS), 2018 IEEE International. :1-5 May, 2018
Academic Journal
Weaver, G.; Delporte, J.; Donley, E.; Weinstein, D.; Everard, J.; Weyers, S.; Seshia, A.; Romisch, S.; Margolis, H.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 65(6):897-897 Jun, 2018
Report
Adamson, P.; Anghel, I.; Ashby, N.; Aurisano, A.; Barr, G.; Bishai, M.; Blake, A.; Bock, G. J.; Bogert, D.; Bumgarner, R.; Cao, S. V.; Castromonte, C. M.; Childress, S.; Coelho, J. A. B.; Corwin, L.; Cronin-Hennessy, D.; de Jong, J. K.; Devan, A. V.; Devenish, N. E.; Diwan, M. V.; Escobar, C. O.; Evans, J. J.; Falk, E.; Feldman, G. J.; Fonville, B.; Frohne, M. V.; Gallagher, H. R.; Gomes, R. A.; Goodman, M. C.; Gouffon, P.; Graf, N.; Gran, R.; Grzelak, K.; Habig, A.; Hahn, S. R.; Hartnell, J.; Hatcher, R.; Hirschauer, J.; Holin, A.; Huang, J.; Hylen, J.; Irwin, G. M.; Isvan, Z.; James, C.; Jefferts, S. R.; Jensen, D.; Kafka, T.; Kasahara, S. M. S.; Koizumi, G.; Kordosky, M.; Kreymer, A.; Lang, K.; Ling, J.; Litchfield, P. J.; Lucas, P.; Mann, W. A.; Marshak, M. L.; Matsakis, D.; Mayer, N.; McKinley, A.; McGivern, C.; Medeiros, M. M.; Mehdiyev, R.; Meier, J. R.; Messier, M. D.; Miller, W. H.; Mishra, S. R.; Mitchell, S.; Sher, S. Moed; Moore, C. D.; Mualem, L.; Musser, J.; Naples, D.; Nelson, J. K.; Newman, H. B.; Nichol, R. J.; Nowak, J. A.; O'Connor, J.; Orchanian, M.; Pahlka, R. B.; Paley, J.; Parker, T. E.; Patterson, R. B.; Pawloski, G.; Perch, A.; Phan-Budd, S.; Plunkett, R. K.; Poonthottathil, N.; Powers, E.; Qiu, X.; Radovic, A.; Rebel, B.; Ridl, K.; Römisch, S.; Rosenfeld, C.; Rubin, H. A.; Sanchez, M. C.; Schneps, J.; Schreckenberger, A.; Schreiner, P.; Sharma, R.; Sousa, A.; Tagg, N.; Talaga, R. L.; Thomas, J.; Thomson, M. A.; Tian, X.; Timmons, A.; Tognini, S. C.; Toner, R.; Torretta, D.; Urheim, J.; Vahle, P.; Viren, B.; Weber, A.; Webb, R. C.; White, C.; Whitehead, L.; Whitehead, L. H.; Wojcicki, S. G.; Wright, J.; Zhang, V.; Zwaska, R.
Academic Journal
Bothwell, T.; Bromley, S.L.; Kedar, D.; Kennedy, C.J.; Milner, W.R.; Oelker, E.; Robinson, J.M.; Sonderhouse, L.; Ye, J.; Chen, J.-S.; Diddams, S.A.; Fasano, R.J.; Hassan, Y.S.; Leibrandt, D.R.; Leopardi, H.; McGrew, W.F.; Nicolodi, D.; Zhang, X.; Deschênes, J.-D.; Brewer, S.M.; Romisch, S.; Schäffer, S.A.; Beloy, K.; Bodine, M.I.; Fortier, T.M.; Hume, D.B.; Khader, I.; Koepke, A.; Ludlow, A.D.; Newbury, N.R.; Parker, T.E.; Sherman, J.A.; Sinclair, L.C.; Swann, W.C.; Yao, J.
In: Nature . (Nature, 25 March 2021, 591(7851):564-569)
Academic Journal
Leopardi, H.; Beloy, K.; Brewer, S.M.; Chen, J.-S.; Diddams, S.A.; Fasano, R.J.; Hassan, Y.S.; Hume, D.B.; Kennedy, C.J.; Leibrandt, D.R.; Ludlow, A.D.; McGrew, W.F.; Nicolodi, D.; Oelker, E.; Parker, T.E.; Romisch, S.; Sherman, J.A.; Yao, J.; Ye, J.; Zhang, X.; Fortier, T.M.; Bothwell, T.; Bromley, S.L.; Kedar, D.; Milner, W.R.; Robinson, J.M.; Sonderhouse, L.
In: Metrologia . (Metrologia, February 2021, 58(1))
Conference
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) Microwave symposium digest Microwave Symposium Digest, 2004 IEEE MTT-S International. 2:1181-1184 Vol.2 2004
Conference
Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Frequency Control Symposium Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International. :718-724 2004
Conference
IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 Frequency control symposium Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International. :401-404 2003
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[AR] Romisch, S.
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