학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 17건 | 목록 1~10
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(2):109-117 Apr, 2023
Academic Journal
In: Journal of Electronic Testing: Theory and Applications (JETTA). (Journal of Electronic Testing: Theory and Applications (JETTA), April 2024, 40(2):215-228)
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):129-141 Jun, 2022
Conference
In: Proceedings of the European Test Workshop, Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024. (Proceedings of the European Test Workshop, 2024)
Conference
In: Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2023, Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2023. (Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2023, 12 November 2023)
Conference
In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration, VLSI-SoC 2023. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, 2023)
Conference
In: Proceedings of the European Test Workshop, Proceedings - 2023 IEEE European Test Symposium, ETS 2023. (Proceedings of the European Test Workshop, 2023, 2023-May)
Conference
In: 2023 IEEE 24th Latin American Test Symposium, LATS 2023, 2023 IEEE 24th Latin American Test Symposium, LATS 2023. (2023 IEEE 24th Latin American Test Symposium, LATS 2023, 2023)
Conference
In: Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023. (Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, 2023, :169-174)
Conference
In: Proceedings of the Asian Test Symposium, Proceedings - 2022 IEEE 31st Asian Test Symposium, ATS 2022. (Proceedings of the Asian Test Symposium, 2022, 2022-November:84-89)
검색 결과 제한하기
제한된 항목
[AR] Rodriguez Condia, J.E.
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