학술논문
'학술논문'
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1~10
Academic Journal
Steinbeis, F.; Knape, P.; Mittermaier, M.; Helbig, E.T.; Tober-Lau, P.; Thibeault, C.; Lippert, L.J.; Xiang, W.; Müller-Plathe, M.; Steinbrecher, S.; Meyer, H.-J.; Ring, R.M.; Ruwwe-Glösenkamp, C.; Alius, F.; Li, Y.; Müller-Redetzky, H.; Uhrig, A.; Lingscheid, T.; Grund, D.; Temmesfeld-Wollbrück, B.; Suttorp, N.; Sander, L.E.; Kurth, F.; Witzenrath, M.; Zoller, T.
In: Respiratory Medicine . (Respiratory Medicine, October 2022, 202)
Academic Journal
Ring, R.M.; Kandil, F.I.; Steckhan, N.; Klatte, C.; Kessler, C.S.; Jeitler, M.; Michalsen, A.; Stöckigt, B.; Koppold-Liebscher, D.A.; Eisenmann, C.; Demmrich, S.; Boschmann, M.; Blakeslee, S.B.; Stritter, W.
In: Nutrients . (Nutrients, March-1 2022, 14(5))
Academic Journal
Steinbeis, F.; Thibeault, C.; Ring, R.M.; Mittermaier, M.; Ruwwe-Glösenkamp, C.; Alius, F.; Knape, P.; Meyer, H.-J.; Lippert, L.J.; Helbig, E.T.; Grund, D.; Temmesfeld-Wollbrück, B.; Suttorp, N.; Sander, L.E.; Kurth, F.; Witzenrath, M.; Zoller, T.; Doellinger, F.; Penzkofer, T.
In: Respiratory Medicine . (Respiratory Medicine, January 2022, 191)
Academic Journal
In: Electronic Device Failure Analysis . (Electronic Device Failure Analysis, November 2023, 25(4):48-49)
Academic Journal
In: Psychology of Religion and Spirituality . (Psychology of Religion and Spirituality, 3 June 2021, 15(4):459-470)
Conference
Cole, E.I., Jr.; Tangyunyong, P.; Hawkins, C.F.; Bruce, M.R.; Bruce, V.J.; Ring, R.M.; Wan-Loong Chong
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :15-21 2002
Conference
Cole, E.I., Jr.; Bruce, M.R.; Barton, D.L.; Tangyunyong, P.; Bruce, V.J.; Hawkins, C.F.; Soden, J.M.; Henderson, C.L.; Ring, R.M.; Chong, W.-L.; Eppes, D.H.; Wilcox, J.; Benson, D.A.
The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. LEOS annual meeting conference proceedings Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE. 2:537-538 vol.2 2003
Academic Journal
Kleindiek, S.; Schock, K.; Rummel, A.; Kemmler, M.; Ring, R.M.; Newkirk, R.; Davidson, K.; Zschornack, M.; Limbecker, P.; Meyer, A.
In: Electronic Device Failure Analysis . (Electronic Device Failure Analysis, 2018, 20(3):24-33)
Academic Journal
In: Electronic Device Failure Analysis . (Electronic Device Failure Analysis, November 2021, 23(4):47-49)
Academic Journal
In: Journal of Psychopharmacology . (Journal of Psychopharmacology, October 2013, 27(10):930-939)
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[AR] Ring, R.M.
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