학술논문

발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 27건 | 목록 1~10
Conference
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) International test conference Test Conference, 1998. Proceedings., International. :194-203 1998
Conference
Proceedings International Test Conference 1997 Test conference Test Conference, 1997. Proceedings., International. :32-39 1997
Conference
Proceedings International Test Conference 1996. Test and Design Validity International test conference Test Conference, 1996. Proceedings., International. :259-268 1996
Conference
Proceedings., International Test Conference International test conference 1994 Test Conference, 1994. Proceedings., International. :413-425 1994
Conference
Proceedings of IEEE International Test Conference - (ITC) International test conference Test Conference, 1993. Proceedings., International. :642-651 1993
Conference
Proceedings of 1995 IEEE International Test Conference (ITC) International test conference Test Conference, 1995. Proceedings., International. :916 1995
Academic Journal
In: IEEE Electron Device Letters. (IEEE Electron Device Letters, September 2011, 32(9):1200-1202)
Conference
2010 10th IEEE International Conference on Solid-State & Integrated Circuit Technology (ICSICT); 2010, p1604-1607, 4p
Conference
2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD); 2010, p1-10, 10p
검색 결과 제한하기
제한된 항목
[AR] Righter, A.W.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어