학술논문
'학술논문'
에서 검색결과 77건 | 목록
1~10
Academic Journal
Rinaudo, P.; Chasin, A.; Franco, J.; Wu, Z.; Subhechha, S.; Arutchelvan, G.; Eneman, G.; Ramana, B.Y.V.; Rassoul, N.; Delhougne, R.; Kaczer, B.; De Wolf, I.; Kar, G.S.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):337-345 Sep, 2023
Conference
Rinaudo, P.; Chasin, A.; Franco, J.; Wu, Z.; Rassoul, N.; Delhougne, R.; Kaczer, B.; Wolf, I. De; Kar, G.S.
2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022
Conference
Belmonte, A.; Kundu, S.; Subhechha, S.; Chasin, A.; Rassoul, N.; Dekkers, H.; Puliyalil, H.; Seidel, F.; Carolan, P.; Delhougne, R.; Kar, G. S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Magnarin, L.; Agati, M.; Belmonte, A.; Subhechha, S.; Rassoul, N.; Drijbooms, C.; Dekkers, H.; Celano, U.
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-4 Jul, 2022
Academic Journal
Tang, H.; Afanas'Ev, V.; Van Houdt, J.; Dekkers, H.; Rassoul, N.; Sutar, S.; Subhechha, S.; Delhougne, R.; Kar, G.S.; Belmonte, A.
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, 1 January 2024, 71(1):567-573)
Conference
Wu, Z.; Chasin, A.; Franco, J.; Subhechha, S.; Dekkers, H.; Bhuvaneshwari, Y.V.; Belmonte, A.; Rassoul, N.; van Setten, M.J.; Afanas'Ev, V.; Delhougne, R.; Kaczer, B.; Kar, G.S.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :30.1.1-30.1.4 Dec, 2022
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Sutar, S.; Magnarin, L.; Celano, U.; Puliyalil, H.; Kundu, S.; Pak, M.; Teugels, L.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Biasotto, C.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :292-293 Jun, 2022
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control
Conference
Subhechha, S.; Rassoul, N.; Belmonte, A.; Hody, H.; Dekkers, H.; van Setten, M. J.; Chasin, A.; Sharifi, S.H.; Banerjee, K.; Puliyalil, H.; Kundu, S.; Pak, M.; Tsvetanova, D.; Bazzazian, N.; Vandersmissen, K.; Batuk, D.; Geypen, J.; Heijlen, J.; Delhougne, R.; Kar, G. S.
2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :88-88 Sep, 2022
Academic Journal
Gupta, A.; Pedreira, O.V.; Arutchelvan, G.; Zahedmanesh, H.; Devriendt, K.; Mertens, H.; Tao, Z.; Ritzenthaler, R.; Wang, S.; Radisic, D.; Kenis, K.; Teugels, L.; Sebai, F.; Lorant, C.; Jourdan, N.; Chan, B.T.; Subramanian, S.; Schleicher, F.; Hopf, T.; Peter, A.P.; Rassoul, N.; Debruyn, H.; Demonie, I.; Siew, Y.K.; Chiarella, T.; Briggs, B.; Zhou, X.; Rosseel, E.; De Keersgieter, A.; Capogreco, E.; Litta, E.D.; Boccardi, G.; Baudot, S.; Mannaert, G.; Bontemps, N.; Sepulveda, A.; Mertens, S.; Kim, M.; Dupuy, E.; Vandersmissen, K.; Paolillo, S.; Yakimets, D.; Chehab, B.; Favia, P.; Drijbooms, C.; Cousserier, J.; Jaysankar, M.; Lazzarino, F.; Morin, P.; Altamirano, E.; Mitard, J.; Wilson, C.J.; Holsteyns, F.; Boemmels, J.; Demuynck, S.; Tokei, Z.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020
Academic Journal
Saito, D.; Doevenspeck, J.; Cosemans, S.; Oh, H.; Perumkunnil, M.; Papistas, I.A.; Belmonte, A.; Rassoul, N.; Delhougne, R.; Kar, G.; Debacker, P.; Mallik, A.; Verkest, D.; Na, M.H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4616-4620 Nov, 2020
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[AR] Rassoul, N.
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