학술논문
'학술논문'
에서 검색결과 14건 | 목록
1~10
Conference
Franco, J.; Arimura, H.; de Marneffe, J.-F.; Vandooren, A.; Ragnarsson, L.-A; Wu, Z.; Claes, D.; Litta, E. Dentoni; Horiguchi, N.; Croes, K.; Linten, D.; Grasser, T.; Kaczer, B.
2021 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2021 International Conference on. :1-4 Sep, 2021
Conference
Franco, J.; Wu, Z.; Rzepa, G.; Ragnarsson, L.-A; Dekkers, H.; Vandooren, A.; Groeseneken, G.; Horiguchi, N.; Collaert, N.; Linten, D.; Grasser, T.; Kaczer, B.
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Conference
Franco, J.; de Marneffe, J.-F.; Vandooren, A.; Arimura, H.; Ragnarsson, L.-A; Claes, D.; Litta, E. Dentoni; Horiguchi, N.; Croes, K.; Linten, D.; Grasser, T.; Kaczer, B.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Franco, J.; Arimura, H.; de Marneffe, J.-F.; Wu, Z.; Vandooren, A.; Ragnarsson, L.-A; Litta, E. Dentoni; Horiguchi, N.; Croes, K.; Linten, D.; Afanas'ev, V.; Grasser, T.; Kaczer, B.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :31.4.1-31.4.4 Dec, 2021
Conference
Franco, J.; de Marneffe, J.-F.; Vandooren, A.; Kimura, Y.; Nyns, L.; Wu, Z.; El-Sayed, A.-M.; Jech, M.; Waldhoer, D.; Claes, D.; Arimura, H.; Ragnarsson, L.-A; Afanas'ev, V.; Stesmans, A.; Horiguchi, N.; Linten, D.; Grasser, T.; Kaczer, B.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :31.2.1-31.2.4 Dec, 2020
Academic Journal
Schram, T.; Ragnarsson, L.-Å; Lujan, G.; Deweerd, W.; Chen, J.; Tsai, W.; Henson, K.; Lander, R.J.P.; Hooker, J.C.; Vertommen, J.; Meyer, K. De; Gendt, S. De; Heyns, M.
In Microelectronics Reliability 2005 45(5):779-782
Conference
Franco, J.; Kaczer, B.; Mitard, J.; Toledano-Luque, M.; Crupi, F.; Eneman, G.; Rousse, Ph. J.; Grasser, T.; Cho, M.; Kauerauf, T.; Witters, L.; Hellings, G.; Ragnarsson, L.-A; Horiguchi, N.; Heyns, M.; Groeseneken, G.
2012 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2012 IEEE International Conference on. :1-4 May, 2012
Conference
Franco, J.; Vais, A.; Sioncke, S.; Putcha, V.; Kaczer, B.; Shie, B.-S.; Shi, X.; Mahlouji, R.; Nyns, L.; Zhou, D.; Waldron, N.; Maes, J.W.; Xie, Q.; Givens, M.; Tang, F.; Jiang, X.; Arimura, H.; Schram, T.; Ragnarsson, L.-A; Sibaja Hernandez, A.; Hellings, G.; Horiguchi, N.; Heyns, M.; Groeseneken, G.; Linten, D.; Collaert, N.; Thean, A.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Franco, J.; Kaczer, B.; Mukhopadhyay, S.; Duhan, P.; Weckx, P.; Roussel, Ph. J.; Chiarella, T.; Ragnarsson, L.-A; Trojman, L.; Horiguchi, N.; Spessot, A.; Linten, D.; Mocuta, A.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :15.3.1-15.3.4 Dec, 2016
Academic Journal
Pantisano, L.; Ragnarsson, L.-A; Houssa, M.; Degraeve, R.; Groeseneken, G.; Schram, T.; Degendt, S.; Heyns, M.; Afanas'ev, V.; Stesmans, A.
In: Materials Science in Semiconductor Processing , E-MRS 2006 Spring Meeting - Symposium L: Characterization of high-k dielectric materials. (Materials Science in Semiconductor Processing, December 2006, 9(6):880-884)
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제한된 항목
[AR] Ragnarsson, L.-Å
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