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발행년	- (예 : 2010-2015)

Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe

Academic Journal

Chen, Y.; Martin, I.; Prosa, T.; Ulfig, R.; Rice, K.P.; Larson, D.J.; Reinhard, D.A.; Lenz, D.; Brewer, N.R.; Holman, M.; Hanna, J.; Groth, G.; Pal, A.S.; Basu, J.

In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. (Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22 July 2023, 29(1):813-814)

Full Text (Oxford University Press) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

Atom probe tomography of oxide scales

Academic Journal

Stiller, K.; Viskari, L.; Sundell, G.; Liu, F.; Thuvander, M.; Andrén, H.-O.; Larson, D.J.; Prosa, T.; Reinhard, D.

In: Oxidation of Metals. (Oxidation of Metals, April 2013, 79(3-4):227-238)

Full Text (Springer-Archive) JCR 저널정보 Scopus Find it@PNU

Local electrode atom probe analysis of silicon nanowires grown with an aluminum catalyst

Academic Journal

Eichfeld, C.M.; Ke, Y.; Redwing, J.M.; Mohney, S.E.; Gerstl, S.S.A.; Prosa, T.

In: Nanotechnology. (Nanotechnology, 1 June 2012, 23(21))

Web of Science JCR 저널정보 Scopus Find it@PNU

Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomography

Academic Journal

Greene, M.; Kelly, T.; Larson, D.; Prosa, T.

In: Journal of Microscopy. (Journal of Microscopy, September 2012, 247(3):288-299)

EBSCOHost PDF Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

Atom Probe Tomography of Oxide Scales

Academic Journal

Stiller, K.; Viskari, L.; Sundell, G.; Liu, F.; Thuvander, M.; Andrén, H.-O.; Larson, D.J.; Prosa, T.; Reinhard, D.

In: Oxidation of Metals. (Oxidation of Metals, In Press, 2012, :1-12)

Full Text (Springer-Archive) JCR 저널정보 Scopus Find it@PNU

Silicon-standard-based Comparisons of LEAP Accuracy and Precision

Academic Journal

Prosa, T.

In: Microscopy and Microanalysis. (Microscopy and Microanalysis, 2020, :2084-2085)

Full Text (Oxford University Press) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

Atomic scale characterization of compound semiconductors using atom probe tomography

Conference

Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T.

In: Conference Record of the IEEE Photovoltaic Specialists Conference, Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. (Conference Record of the IEEE Photovoltaic Specialists Conference, 2011, :003357-003359)

Full Text (IEEE) Scopus Find it@PNU

Ion Beam Nanodissection for 3D Compositional Mapping of Mammalian Cells.

Academic Journal

Fu, J.; Narayan, K.; Prosa, T.; Subramaniam, S.

Microscopy & Microanalysis; Jul2010 Supplement, Vol. 16 Issue S2, p180-181, 2p

Full Text (Oxford University Press) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

Analysis of silicon nanowires by laser atom probe tomography prepared by a protected lift-out processing technique

Academic Journal

Prosa, T.; Alvis, R.; Tsakalakos, L.; Smentkowski, V.

In: Microscopy and Microanalysis. (Microscopy and Microanalysis, August 2008, 14(SUPPL. 2):456-457)

Full Text (Oxford University Press) Full Text (ProQuest Central) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

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