학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 85건 | 목록 1~10
Conference
In: Proceedings of the 2024 Argentine Conference on Electronics, CAE 2024 - Congreso Argentino de Electronica 2024, CAE 2024, Proceedings of the 2024 Argentine Conference on Electronics, CAE 2024 - Congreso Argentino de Electronica 2024, CAE 2024. (Proceedings of the 2024 Argentine Conference on Electronics, CAE 2024 - Congreso Argentino de Electronica 2024, CAE 2024, 2024, :160-171)
Conference
Third International Symposium on Information Processing in Sensor Networks, 2004. IPSN 2004 Information processing in sensor networks Information Processing in Sensor Networks, 2004. IPSN 2004. Third International Symposium on. :134-141 2004
Conference
2000 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 2000 IEEE International Symposium on. 4:329-332 vol.4 2000
Conference
IJCNN'99. International Joint Conference on Neural Networks. Proceedings (Cat. No.99CH36339) Neural networks Neural Networks, 1999. IJCNN '99. International Joint Conference on. 4:2333-2336 vol.4 1999
Conference
Proceedings of the 39th Midwest Symposium on Circuits and Systems Midwest symposium on circuits and systems Circuits and Systems, 1996., IEEE 39th Midwest symposium on. 1:183-186 vol.1 1996
Conference
1994 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 1994 IEEE International Symposium on. 5:45-48 vol.5 1994
Conference
Proceedings of 36th Midwest Symposium on Circuits and Systems Circuits and systems Midwest symposium Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on. :762-765 vol.1 1993
Conference
Proceedings of 36th Midwest Symposium on Circuits and Systems Circuits and systems Midwest symposium Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on. :570-573 vol.1 1993
Conference
Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on. :327-334 1993
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제한된 항목
[AR] Pouliquen, P.O.
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