학술논문
'학술논문'
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1~10
Academic Journal
In Microelectronics Reliability November 2023 150
Conference
Medeiros, G.C.; Fieback, M.; Copetti, T.S.; Gebregiorgis, A.; Taouil, M.; Poehls, L.B.; Hamdioui, S.
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2021 16th International Conference on. :1-6 Jun, 2021
Conference
Pelke, R.; Staudigl, F.; Thomas, N.; Bosbach, N.; Hossein, M.; Cubero-Cascante, J.; Leupers, R.; Joseph, J.M.; Poehls, L.B.
In: 2024 IEEE 25th Latin American Test Symposium, LATS 2024 , 2024 IEEE 25th Latin American Test Symposium, LATS 2024. (2024 IEEE 25th Latin American Test Symposium, LATS 2024, 2024)
Conference
Palermo, N.; Tihhomirov, V.; Copetti, T.S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, G.; Reorda, M.S.; Vargas, F.; Poehls, L.B.
2015 16th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2015 16th Latin-American. :1-6 Mar, 2015
Conference
2015 16th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2015 16th Latin-American. :1-6 Mar, 2015
Academic Journal
Benfica, J.; Green, B.; Porcher, B.C.; Poehls, L.B.; Vargas, F.; Medina, N.H.; Added, N.; de Aguiar, V.A.P.; Macchione, E.L.A.; Aguirre, F.; Silveira, M.A.G.; Perez, M.; Sofo Haro, M.; Sidelnik, I.; Blostein, J.; Lipovetzky, J.; Bezerra, E.A.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 63(2):1294-1300 Apr, 2016
Academic Journal
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), April 2019, 35(2):191-200)
Conference
Aziza, H.; Copetti, T.; Poehls, L.B.; Xun, H.; Fieback, M.; Yuan, S.; Heidekamp, M.; Taouil, M.; Hamdioui, S.
In: Proceedings of the Asian Test Symposium , Proceedings of the 2023 IEEE 32nd Asian Test Symposium, ATS 2023. (Proceedings of the Asian Test Symposium, 2023)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, September 2018, 88-90:214-218)
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, 1 December 2016, 67:150-158)
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[AR] Poehls, L.B.
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