학술논문
'학술논문'
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Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Ko-Min Chang; White, B.E., Jr.
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :31-35 2004
Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Ko-Min Chang; White, B.E., Jr.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :26.2.1-26.2.4 2003
Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Chang, K.-M.; White Jr., B.E.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2003, :601-604)
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[AR] Paransky, M.
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