학술논문
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Conference
Chen, Yen-Huei; Chan, Wei-Min; Wu, Wei-Cheng; Liao, Hung-Jen; Pan, Kuo-Hua; Liaw, Jhon-Jhy; Chung, Tang-Hsuan; Li, Quincy; Chang, George H.; Lin, Chih-Yung; Chiang, Mu-Chi; Wu, Shien-Yang; Natarajan, Sreedhar; Chang, Jonathan
2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International. :238-239 Feb, 2014
Academic Journal
Chen, Yen-Huei; Chan, Wei-Min; Wu, Wei-Cheng; Liao, Hung-Jen; Pan, Kuo-Hua; Liaw, Jhon-Jhy; Chung, Tang-Hsuan; Li, Quincy; Lin, Chih-Yung; Chiang, Mu-Chi; Wu, Shien-Yang; Chang, Jonathan
IEEE Journal of Solid-State Circuits; Jan2015, Vol. 50 Issue 1, p170-177, 8p
Conference
In: IEEE International Conference on Microelectronic Test Structures . (IEEE International Conference on Microelectronic Test Structures, 1996, :43-47)
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[AR] Pan, Kuo-Hua
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