학술논문
'학술논문'
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1~10
Conference
Pirro, Luca; Chohan, Talha; Liebscher, Philipp; Juettner, Maximilian; Holzmueller, Felix; Jain, Ruchil; Raffel, Yannick; Seidel, Konrad; Olivo, Ricardo Revello; Zaka, Alban; Hoentschel, Jan
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024
Conference
Yadav, Nandakishor; Raffel, Yannick; Olivo, Ricardo Revello; Pirro, Luca; Kampfe, Thomas; Seidel, Konrad
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023
Academic Journal
Raffel, Yannick; De, Sourav; Lederer, Maximilian; Olivo, Ricardo Revello; Hoffmann, Raik; Thunder, Sunanda; Pirro, Luca; Beyer, Sven; Chohan, Talha; Kämpfe, Thomas; Seidel, Konrad; Heitmann, Johannes
ACS Applied Electronic Materials; 11/22/2022, Vol. 4 Issue 11, p5292-5300, 9p
Academic Journal
Vogel, Tobias; Zintler, Alexander; Kaiser, Nico; Guillaume, Nicolas; Lefèvre, Gauthier; Lederer, Maximilian; Serra, Anna Lisa; Piros, Eszter; Kim, Taewook; Schreyer, Philipp; Winkler, Robert; Nasiou, Déspina; Olivo, Ricardo Revello; Ali, Tarek; Lehninger, David; Arzumanov, Alexey; Charpin-Nicolle, Christelle; Bourgeois, Guillaume; Grenouillet, Laurent; Cyrille, Marie-Claire
ACS Nano; 9/27/2022, Vol. 16 Issue 9, p14463-14478, 16p
Academic Journal
Raffel, Yannick; Sourav De, Sourav; Lederer, Maximilian; Olivo, Ricardo Revello; Hoffmann, Raik; Thunder, Sunanda; Pirro, Luca; Beyer, Sven; Chohan, Talha; Kaempfe, Thomas; Seidel, Konrad; Heitmann, Johannes
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제한된 항목
[AR] Olivo, Ricardo Revello
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