학술논문
'학술논문'
에서 검색결과 6건 | 목록
1~10
Conference
Sato, Keno; Nakatani, Takayuki; Katayama, Shogo; Iimori, Daisuke; Ogihara, Gaku; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Zhao, Yujie; Katoh, Kentaroh; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo
2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :37-42 Nov, 2022
Conference
Ogihara, Gaku; Nakatani, Takayuki; Iimori, Daisuke; Katayama, Shogo; Kuwana, Anna; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Zhao, Yujie; Wei, Jianglin; Hatayama, Kazumi; Kobayashi, Haruo
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Electronics, Circuits, and Systems (ICECS), 2021 28th IEEE International Conference on. :1-6 Nov, 2021
Conference
Iimori, Daisuke; Nakatani, Takayuki; Katayama, Shogo; Ogihara, Gaku; Hatta, Akemi; Kuwana, Anna; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Wei, Jianglin; Zhao, Yujie; Tran, Tri Minh; Hatayama, Kazumi; Kobayashi, Haruo
2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :364-373 Oct, 2021
Conference
Ogihara, Gaku; Nakatani, Takayuki; Hatta, Akemi; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Kuwana, Anna; Aoki, Riho; Katayama, Shogo; Wei, Jianglin; Zhao, Yujie; Wang, Jianlong; Hatayama, Kazumi; Kobayashi, Haruo
2020 IEEE 29th Asian Test Symposium (ATS) Asian Test Symposium (ATS), 2020 IEEE 29th. :1-6 Nov, 2020
Conference
Mangelsdorf, Chris; Madhvaraj, Manasa; Mir, Salvador; Barragan, Manuel; Iimori, Daisuke; Nakatani, Takayuki; Katayama, Shogo; Ogihara, Gaku; Zhao, Yujie; Wei, Jianglin; Kuwana, Anna; Katoh, Kentaroh; Hatayama, Kazumi; Kobayashi, Haruo; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-1 Apr, 2022
Conference
Sato, Keno; Nakatani, Takayuki; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Katayama, Shogo; Ogihara, Gaku; Iimori, Daisuke; Zhao, Yujie; Wei, Jianglin; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo
2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :139-140 Nov, 2021
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제한된 항목
[AR] Ogihara, Gaku
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