학술논문
'학술논문'
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1~10
Academic Journal
In Microelectronics Reliability December 2017 79:281-287
Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
Conference
Vidal-Dho, Matthias; Hubert, Quentin; Gonon, Patrice; Pelissier, Bernard; Fornara, Pascal; Escales, Jean-Philippe; Potard, Pascale; Moragues, Jean-Michel; Ogier, Jean-Luc
2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019
Conference
Morillon, Dann; Masson, Pascal; Julien, Franck; Lorenzini, Philippe; Goy, Jerome; Pribat, Clement; Gourhant, Olivier; Kempf, Thibault; Ogier, Jean-Luc; Villaret, Alexandre; Ghezzi, Giada; Cherault, Nathalie; Niel, Stephan
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Conference
Morillon, Dann; Pribat, Clement; Julien, Franck; Cherault, Nathalie; Goy, Jerome; Gourhant, Olivier; Ogier, Jean-Luc; Masson, Pascal; Ghezzi, Giada; Kempf, Thibault; Delalleau, Julien; Villaret, Alexandre; Grenier, Jean-Christophe; Niel, Stephan
2017 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2017 IEEE International. :1-4 Oct, 2017
Conference
Marca, Vincenzo Della; Amouroux, Julien; Delalleau, Julien; Lopez, Laurent; Ogier, Jean-Luc; Postel-Pellerin, Jeremy; Lalande, Frederic; Molas, Gabriel
CAS 2011 Proceedings (2011 International Semiconductor Conference) Semiconductor Conference (CAS), 2011 International. 2:339-342 Oct, 2011
Conference
2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :12-15 Oct, 2008
Conference
2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :60-63 Oct, 2008
Conference
2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :7-11 Oct, 2008
Academic Journal
IEEE Transactions on Device & Materials Reliability; Dec2016, Vol. 16 Issue 4, p597-603, 7p
Academic Journal
Joly, Yohan; Lopez, Laurent; Truphemus, Laurent; Portal, Jean-Michel; Aziza, Hassen; Julien, Franck; Fornara, Pascal; Masson, Pascal; Ogier, Jean-Luc; Bert, Yannick
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[AR] Ogier, Jean-Luc
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