학술논문
'학술논문'
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Report
Nörenberg, Tobias; Álvarez-Pérez, Gonzalo; Obst, Maximilian; Wehmeier, Lukas; Hempel, Franz; Klopf, J. Michael; Nikitin, Alexey Y.; Kehr, Susanne C.; Eng, Lukas M.; Alonso-González, Pablo; de Oliveira, Thales V. A. G.
ACS Nano 2022, 16, 20174-20185
Report
de Oliveira, Thales V. A. G.; Nörenberg, Tobias; Álvarez-Pérez, Gonzalo; Wehmeier, Lukas; Taboada-Gutiérrez, Javier; Obst, Maximilian; Hempel, Franz; Lee, Eduardo J. H.; Klopf, John M.; Errea, Ion; Nikitin, Alexey Y.; Kehr, Susanne C.; Alonso-Gonzaléz, Pablo; Eng, Lukas M.
Adv. Mater. 2021, 33, 2005777
Academic Journal
Feres, Flávio H.; Barcelos, Ingrid D.; Cadore, Alisson R.; Wehmeier, Lukas; Nörenberg, Tobias; Mayer, Rafael A.; Freitas, Raul O.; Eng, Lukas M.; Kehr, Susanne C.; Maia, Francisco C. B.
Nano Letters; 5/10/2023, Vol. 23 Issue 9, p3913-3920, 8p
Academic Journal
Wehmeier, Lukas; Nörenberg, Tobias; de Oliveira, Thales VAG; Klopf, J Michael; Yang, Seung-Yeul; Martin, Lane W; Ramesh, Ramamoorthy; Eng, Lukas M; Kehr, Susanne C
Applied Physics Letters. 116(7)
Academic Journal
Nörenberg, Tobias; Álvarez-Pérez, Gonzalo; Obst, Maximilian; Wehmeier, Lukas; Hempel, Franz; Klopf, J. Michael; Nikitin, Alexey Y.; Kehr, Susanne C.; Eng, Lukas M.; Alonso-González, Pablo; de Oliveira, Thales V. A. G.
ACS Nano; 12/27/2022, Vol. 16 Issue 12, p20174-20185, 12p
Academic Journal
Firkala, Tamás; Kuschewski, Frederik; Nörenberg, Tobias; Klopf, J. Michael; Pashkin, Alexej; Foerstendorf, Harald; Rudolph, Martin; Kehr, Susanne C.; Eng, Lukas M.
Academic Journal
APL Photonics; Mar2021, Vol. 6 Issue 3, p1-8, 8p
Academic Journal
Oliveira, Thales V. A. G.; Nörenberg, Tobias; Álvarez‐Pérez, Gonzalo; Wehmeier, Lukas; Taboada‐Gutiérrez, Javier; Obst, Maximilian; Hempel, Franz; Lee, Eduardo J. H.; Klopf, J. Michael; Errea, Ion; Nikitin, Alexey Y.; Kehr, Susanne C.; Alonso‐González, Pablo; Eng, Lukas M.
Advanced Materials; 1/14/2021, Vol. 33 Issue 2, p1-7, 7p
Academic Journal
Döring, Jonathan; Lang, Denny; Wehmeier, Lukas; Kuschewski, Frederik; Nörenberg, Tobias; Kehr, Susanne C.; Eng, Lukas M.
Nanoscale; 10/7/2018, Vol. 10 Issue 37, p18074-18079, 6p
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[AR] Nörenberg, Tobias
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