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In Nuclear Engineering and Technology February 2024
Academic Journal
Felice, P.D.; Capogni, M.; Anuradha, R.; Joseph, L.; Kulkami, D.B.; Bludovsky, J.; Bobin, C.; Bosley, R.; Pateman, D.; Broda, R.; Ziemek, T.; Collins, S.M.; Keightley, J.D.; Dix, T.; Netwon, S.; Frechou, C.; Hutchins, S.; Slade, J.; Ioan, R.; Sahagia, M.; Stanga, D.; Javornik, A.; Svec, A.; Zanevsky, A.; Kharitonov, I.A.; Sokolova, I.A.; King, L.; Unterweger, M.; Lewis, G.; Arcos, J.M.L.; Maringer, F.J.; Mihelic, M.; Msimang, Z.; Sparrow, R.; Thoka, W.; Nahle, O.; Zhao, Q.; Sato, Y.; Yunoki, A.; Stanev, S.; Szucs, L.; Woods, M.J.; Yamada, T.; Yamamoto, S.
In: Metrologia . (Metrologia, January 2022, 59(1A))
Academic Journal
Lin, Y.C.; Lee, J.H.; Butler, D.; Webb, D.; Krauss, A.; Kurosawa, T.; Morishita, Y.; Bero, M.; Vinatha, S.P.; Budiantari, C.T.; Srimanoroth, S.; Chun, K.J.; Wang, K.; Khaled, N.E.; Kadni, T.B.; Msimang, Z.; Laban, J.
In: Metrologia . (Metrologia, January 2021, 58(1))
Academic Journal
Judge, S. M.; Coulon, R. M.; Cox, M. G.; Karam, L.; Knoll, P.; Michotte, C.; Msimang, Z.; Zimmerman, B. E.
Academic Journal
Schumacher, B.; Warnecke, P.; Poirier, W.; Delgado, I.; Msimang, Z.; Boella, G.; Hetland, P.O.; Elmquist, R.E.; Williams, J.; Inglis, D.; Jeckelmann, B.; Gunnarsson, O.; Satrapinsky, A.
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 50(2):242-244 Apr, 2001
Academic Journal
Nylund, R.; Prez, L.A.D.; Hetland, P.O.; Andersen, C.E.; Aviles, P.; Mulas, C.G.; Msimang, Z.; Czap, L.; Persson, L.
In: Metrologia . (Metrologia, 1 January 2023, 60(1A))
Book
In: The Coronavirus Crisis and Challenges to Social Development: Global Perspectives . (The Coronavirus Crisis and Challenges to Social Development: Global Perspectives, 1 January 2022, :vii-viii)
Academic Journal
In: Radiation Protection Dosimetry . (Radiation Protection Dosimetry, March 2011, 144(1-4):282-286)
Academic Journal
Elmquist, R.E.; Schumacher, B.; Warnecke, P.; Poirier, W.; Delgado, I.; Msimang, Z.; Boella, G.; Hetland, P.O.; Williams, J.; Inglis, D.; Jeckelmann, B.; Gunnarsson, O.; Satrapinsky, A.
In: IEEE Transactions on Instrumentation and Measurement . (IEEE Transactions on Instrumentation and Measurement, April 2001, 50(2):242-244)
Academic Journal
Schneider, T.; Behrens, R.; Garcia-Yip, F.; Tanderup, K.; Kertzscher, G.; Johanson, J.; Georgi, P.; Blideanu, V.; Stien, C.; Plagnard, J.; Solc, J.; Sochor, V.; Pinto, M.; Sander, T.; Subiel, A.; Gouldstone, C.; de Prez, L.; Verhaegen, F.; Reniers, B.; Aviles Lucas, P.; Msimang, Z.; Eaton, D. J.; Weigand, F.; Rivard, M. J.
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[AR] Msimang, Z.
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