학술논문
'학술논문'
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Academic Journal
Chen, Mengnuo; Mainardi, Sara; Lieftink, Cor; Velds, Arno; de Rink, Iris; Yang, Chen; Kuiken, Hendrik J.; Morris, Ben; Edwards, Finn; Jochems, Fleur; van Tellingen, Olaf; Boeije, Manon; Proost, Natalie; Jansen, Robin A.; Qin, Shifan; Jin, Haojie; Koen van der Mijn, J.C.; Schepers, Arnout; Venkatesan, Subramanian; Qin, Wenxin; Beijersbergen, Roderick L.; Wang, Liqin; Bernards, René
In Cell Reports Medicine 19 March 2024 5(3)
Conference
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-6 Apr, 2024
Academic Journal
Bhin, Jinhyuk; Paes Dias, Mariana; Gogola, Ewa; Rolfs, Frank; Piersma, Sander R.; de Bruijn, Roebi; de Ruiter, Julian R.; van den Broek, Bram; Duarte, Alexandra A.; Sol, Wendy; van der Heijden, Ingrid; Andronikou, Christina; Kaiponen, Taina S.; Bakker, Lara; Lieftink, Cor; Morris, Ben; Beijersbergen, Roderick L.; van de Ven, Marieke; Jimenez, Connie R.; Wessels, Lodewyk F.A.; Rottenberg, Sven; Jonkers, Jos
In Cell Reports 30 May 2023 42(5)
Academic Journal
Proceedings of the Annual Meeting of the Cognitive Science Society. 46
Academic Journal
Vergara, Xabier; Manjón, Anna G.; de Haas, Marcel; Morris, Ben; Schep, Ruben; Leemans, Christ; Friskes, Anoek; Beijersbergen, Roderick L.; Sanders, Mathijs A.; Medema, René H.; van Steensel, Bas
Nature Communications; 6/22/2024, Vol. 15 Issue 1, p1-14, 14p
Conference
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022
Academic Journal
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[AR] Morris, Ben
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