학술논문
'학술논문'
에서 검색결과 143건 | 목록
1~10
Conference
2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :63-72 Sep, 2022
Conference
2016 IEEE 25th Asian Test Symposium (ATS) Asian Test Symposium, 2016 IEEE 25th Asian Test Symposium (ATS), 2016 IEEE 25th. :173-178 Nov, 2016
Conference
Asada, K.; Wen, X.; Holst, S.; Miyase, K.; Kajihara, S.; Kochte, M. A.; Schneider, E.; Wunderlich, H.-J.; Qian, J.
2015 IEEE 24th Asian Test Symposium (ATS) Test Symposium (ATS), 2015 IEEE 24th Asian. :103-108 Nov, 2015
Conference
2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-10 Nov, 2012
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling
Conference
Miyase, K.; Uchinodan, Y.; Enokimoto, K.; Yamato, Y.; Wen, X.; Kajihara, S.; Wu, F.; Dilillo, L.; Bosio, A.; Girard, P.; Virazel, A.
2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :90-95 Nov, 2011
Conference
2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :506-510 Nov, 2011
Conference
Wen, X.; Enokimoto, K.; Miyase, K.; Yamato, Y.; Kochte, M. A.; Kajihara, S.; Girard, P.; Tehranipoor, M.
29th VLSI Test Symposium VLSI Test Symposium (VTS), 2011 IEEE 29th. :166-171 May, 2011
Conference
Wu, F.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Tehranipoor, M.; Miyase, K.; Wen, X.; Ahmed, N.
2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on. :1-6 Apr, 2011
Conference
2011 Design, Automation & Test in Europe Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011. :1-4 Mar, 2011
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제한된 항목
[AR] Miyase, K.
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