학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 68건 | 목록 1~10
Conference
2022 Joint 12th International Conference on Soft Computing and Intelligent Systems and 23rd International Symposium on Advanced Intelligent Systems (SCIS&ISIS) Soft Computing and Intelligent Systems and 23rd International Symposium on Advanced Intelligent Systems (SCIS&ISIS), 2022 Joint 12th International Conference on. :1-6 Nov, 2022
Conference
2022 Joint 12th International Conference on Soft Computing and Intelligent Systems and 23rd International Symposium on Advanced Intelligent Systems (SCIS&ISIS) Soft Computing and Intelligent Systems and 23rd International Symposium on Advanced Intelligent Systems (SCIS&ISIS), 2022 Joint 12th International Conference on. :1-6 Nov, 2022
Conference
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-6 Jun, 2021
Conference
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2020 IEEE 26th International Symposium on. :1-6 Jul, 2020
Conference
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2020 IEEE 26th International Symposium on. :1-6 Jul, 2020
Conference
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :48-51 Jul, 2019
Conference
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd International Symposium on. :151-156 Jul, 2017
Conference
2020 IEEE 38th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2020 IEEE 38th. :1-1 Apr, 2020
Conference
2014 IEEE 23rd Asian Test Symposium Test Symposium (ATS), 2014 IEEE 23rd Asian. :156-161 Nov, 2014
Conference
2014 IEEE 23rd Asian Test Symposium Test Symposium (ATS), 2014 IEEE 23rd Asian. :254-257 Nov, 2014
검색 결과 제한하기
제한된 항목
[AR] Miura, Yukiya
발행연도 제한
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