학술논문
'학술논문'
에서 검색결과 664건 | 목록
1~10
Conference
Chiarella, T.; Matagne, P.; Mertens, H.; Hosseini, M.; Zhou, X.; Eyben, P.; Arimura, H.; Gupta, A.; Richard, O.; Drijbooms, C.; Caluwaerts, R.; Horiguchi, N.; Mitard, J.
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Academic Journal
Guo, Z.; Li, K.; Li, X.; Luo, X.; Zhang, E.X.; Reed, R.A.; Schrimpf, R.D.; Fleetwood, D.M.; Chasin, A.; Mitard, J.; Linten, D.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(8):2002-2007 Aug, 2023
Academic Journal
Eyben, P.; De Keersgieter, A.; Matagne, P.; Chiarella, T.; Porret, C.; Siew, Y.K.; Goux, L.; Mitard, J.; Horiguchi, N.; Hikavyy, A.
In: Japanese Journal of Applied Physics . (Japanese Journal of Applied Physics, 1 April 2024, 63(4))
Academic Journal
Luo, X.; Zhang, E.X.; Wang, P.F.; Li, K.; Linten, D.; Mitard, J.; Reed, R.A.; Fleetwood, D.M.; Schrimpf, R.D.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(1):153-161 Mar, 2023
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):6985-6990 Dec, 2022
Conference
Mertens, H.; Hosseini, M.; Chiarella, T.; Zhou, D.; Wang, S.; Mannaert, G.; Dupuy, E.; Radisic, D.; Tao, Z.; Oniki, Y.; Hikavyy, A.; Rosseel, R.; Mingardi, A.; Choudhury, S.; Gowda, P. Puttarame; Sebaai, F.; Peter, A.; Vandersmissen, K.; Soulie, J.P.; Keersgieter, A. De; Lima, L. Petersen Barbosa; Cavalcante, C.; Batuk, D.; Martinez, G.T.; Geypen, J.; Seidel, F.; Paulussen, K.; Favia, P.; Boemmels, J.; Loo, R.; Wong, P.; Marquez, A. Sepulveda; Chan, B.T.; Mitard, J.; Subramanian, S.; Demuynck, S.; Litta, E. Dentoni; Horiguchi, N.; Samavedam, S.; Biesemans, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Arimura, H.; Brus, S.; Franco, J.; Oniki, Y.; Vandooren, A.; Conard, T.; Chan, B.-T.; Kannan, B.; Samiee, M.; Li, W.; Deminskyi, P.; Shero, E.; Bakke, J.; Jourdan, N.; Verni, G. Alessio; Maes, J. W.; Givens, M.; Ragnarsson, L.-A.; Mitard, J.; Litta, E. Dentoni; Horiguchi, N.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Academic Journal
Yamaguchi, S.; Witters, L.; Mitard, J.; Eneman, G.; Hellings, G.; Hikavyy, A.; Loo, R.; Horiguchi, N.
In Microelectronics Reliability April 2018 83:157-161
Academic Journal
Bonaldo, S.; Gorchichko, M.; Zhang, E.X.; Ma, T.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Gerardin, S.; Schrimpf, R.D.; Reed, R.A.; Linten, D.; Mitard, J.; Fleetwood, D.M.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(7):1444-1452 Jul, 2022
Conference
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Nuclear and Space Radiation Effects Conference (NSREC), 2021 IEEE. :1-7 Jul, 2021
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[AR] Mitard, J.
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